Bias in pruned vision models: In-depth analysis and countermeasures
E.B. Iofinova, A. Krumes, D.-A. Alistarh, in:, 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2023, pp. 24364–24373.

How well do sparse ImageNet models transfer?
E.B. Iofinova, A. Krumes, M. Kurtz, D.-A. Alistarh, in:, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Institute of Electrical and Electronics Engineers, 2022, pp. 12256–12266.

Leveling down in computer vision: Pareto inefficiencies in fair deep classifiers
D. Zietlow, M. Lohaus, G. Balakrishnan, M. Kleindessner, F. Locatello, B. Scholkopf, C. Russell, in:, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Institute of Electrical and Electronics Engineers, 2022, pp. 10400–10411.

Repmet: Representative-based metric learning for classification and few-shot object detection
L. Karlinsky, J. Shtok, S. Harary, E. Schwartz, A. Aides, R. Feris, R. Giryes, A.M. Bronstein, in:, 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2020.

Laso: Label-set operations networks for multi-label few-shot learning
A. Alfassy, L. Karlinsky, A. Aides, J. Shtok, S. Harary, R. Feris, R. Giryes, A.M. Bronstein, in:, 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2020.

Unsupervised learning of dense shape correspondence
O. Halimi, O. Litany, E.R. Rodola, A.M. Bronstein, R. Kimmel, in:, 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2020.

Leveraging 2D data to learn textured 3D mesh generation
P.M. Henderson, V. Tsiminaki, C. Lampert, in:, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2020, pp. 7498–7507.

Learning intelligent dialogs for bounding box annotation
J. Uijlings, K. Konyushkova, C. Lampert, V. Ferrari, in:, 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2018, pp. 9175–9184.

Deformable shape completion with graph convolutional autoencoders
O. Litany, A.M. Bronstein, M. Bronstein, A. Makadia, in:, 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, IEEE, 2018.