A duality between surface charge and work function in scanning Kelvin probe microscopy
I.C. Lenton, F. Pertl, L.B. Shafeek, S.R. Waitukaitis, Advanced Materials Interfaces (2025).

No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces
F. Pertl, I.C. Lenton, T. Cramer, S.R. Waitukaitis, Physical Review Letters 135 (2025).

Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging
I.C. Lenton, F. Pertl, L.B. Shafeek, S.R. Waitukaitis, Journal of Applied Physics 136 (2024).

Measuring spontaneous charging of single aerosol particles
A. Stöllner, I.C. Lenton, C.J. Muller, S.R. Waitukaitis, in:, EGU General Assembly 2023, European Geosciences Union, 2023.