---
_id: '18285'
abstract:
- lang: eng
  text: Single image depth estimation is achieved using computational imaging and
    Deep Learning (DL). Imaging with phase-mask is also modeled as a DL-layer, and
    the mask and DL parameters are jointly designed using labeled data.
article_number: CW3B.3
article_processing_charge: No
author:
- first_name: Harel
  full_name: Haim, Harel
  last_name: Haim
- first_name: Shay
  full_name: Elmalem, Shay
  last_name: Elmalem
- first_name: Raja
  full_name: Giryes, Raja
  last_name: Giryes
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
- first_name: Emanuel
  full_name: Marom, Emanuel
  last_name: Marom
citation:
  ama: 'Haim H, Elmalem S, Giryes R, Bronstein AM, Marom E. Deep learned phase mask
    for single image depth estimation and 3D scanning. In: <i>Imaging and Applied
    Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C, MATH, PcAOP)</i>. Vol
    Part F99-COSI 2018. OSA; 2018. doi:<a href="https://doi.org/10.1364/cosi.2018.cw3b.3">10.1364/cosi.2018.cw3b.3</a>'
  apa: 'Haim, H., Elmalem, S., Giryes, R., Bronstein, A. M., &#38; Marom, E. (2018).
    Deep learned phase mask for single image depth estimation and 3D scanning. In
    <i>Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C,
    MATH, pcAOP)</i> (Vol. Part F99-COSI 2018). Orlando, FL, United States: OSA. <a
    href="https://doi.org/10.1364/cosi.2018.cw3b.3">https://doi.org/10.1364/cosi.2018.cw3b.3</a>'
  chicago: Haim, Harel, Shay Elmalem, Raja Giryes, Alex M. Bronstein, and Emanuel
    Marom. “Deep Learned Phase Mask for Single Image Depth Estimation and 3D Scanning.”
    In <i>Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C,
    MATH, PcAOP)</i>, Vol. Part F99-COSI 2018. OSA, 2018. <a href="https://doi.org/10.1364/cosi.2018.cw3b.3">https://doi.org/10.1364/cosi.2018.cw3b.3</a>.
  ieee: H. Haim, S. Elmalem, R. Giryes, A. M. Bronstein, and E. Marom, “Deep learned
    phase mask for single image depth estimation and 3D scanning,” in <i>Imaging and
    Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C, MATH, pcAOP)</i>,
    Orlando, FL, United States, 2018, vol. Part F99-COSI 2018.
  ista: 'Haim H, Elmalem S, Giryes R, Bronstein AM, Marom E. 2018. Deep learned phase
    mask for single image depth estimation and 3D scanning. Imaging and Applied Optics
    2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C, MATH, pcAOP). COSI: Computational
    Optical Sensing and Imaging vol. Part F99-COSI 2018, CW3B.3.'
  mla: Haim, Harel, et al. “Deep Learned Phase Mask for Single Image Depth Estimation
    and 3D Scanning.” <i>Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS,
    LACSEA, LS&#38;C, MATH, PcAOP)</i>, vol. Part F99-COSI 2018, CW3B.3, OSA, 2018,
    doi:<a href="https://doi.org/10.1364/cosi.2018.cw3b.3">10.1364/cosi.2018.cw3b.3</a>.
  short: H. Haim, S. Elmalem, R. Giryes, A.M. Bronstein, E. Marom, in:, Imaging and
    Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&#38;C, MATH, PcAOP),
    OSA, 2018.
conference:
  end_date: 2018-06-28
  location: Orlando, FL, United States
  name: 'COSI: Computational Optical Sensing and Imaging'
  start_date: 2018-06-25
date_created: 2024-10-09T07:48:24Z
date_published: 2018-06-01T00:00:00Z
date_updated: 2025-01-23T12:42:46Z
day: '01'
doi: 10.1364/cosi.2018.cw3b.3
extern: '1'
language:
- iso: eng
month: '06'
oa_version: None
publication: Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C,
  MATH, pcAOP)
publication_identifier:
  isbn:
  - '9781943580446'
publication_status: published
publisher: OSA
quality_controlled: '1'
scopus_import: '1'
status: public
title: Deep learned phase mask for single image depth estimation and 3D scanning
type: conference
user_id: 3E5EF7F0-F248-11E8-B48F-1D18A9856A87
volume: Part F99-COSI 2018
year: '2018'
...