---
_id: '14739'
abstract:
- lang: eng
  text: Attempts to incorporate topological information in supervised learning tasks
    have resulted in the creation of several techniques for vectorizing persistent
    homology barcodes. In this paper, we study thirteen such methods. Besides describing
    an organizational framework for these methods, we comprehensively benchmark them
    against three well-known classification tasks. Surprisingly, we discover that
    the best-performing method is a simple vectorization, which consists only of a
    few elementary summary statistics. Finally, we provide a convenient web application
    which has been designed to facilitate exploration and experimentation with various
    vectorization methods.
acknowledgement: "The work of Maria-Jose Jimenez, Eduardo Paluzo-Hidalgo and Manuel
  Soriano-Trigueros was supported in part by the Spanish grant Ministerio de Ciencia
  e Innovacion under Grants TED2021-129438B-I00 and PID2019-107339GB-I00, and in part
  by REXASI-PRO H-EU project, call HORIZON-CL4-2021-HUMAN-01-01 under Grant 101070028.
  The work of\r\nMaria-Jose Jimenez was supported by a grant of Convocatoria de la
  Universidad de Sevilla para la recualificacion del sistema universitario español,
  2021-23, funded by the European Union, NextGenerationEU. The work of Vidit Nanda
  was supported in part by EPSRC under Grant EP/R018472/1 and in part by US AFOSR
  under Grant FA9550-22-1-0462. \r\nWe are grateful to the team of GUDHI and TEASPOON
  developers, for their work and their support. We are also grateful to Streamlit
  for providing extra resources to deploy the web app\r\nonline on Streamlit community
  cloud. We thank the anonymous referees for their helpful suggestions."
article_processing_charge: Yes (in subscription journal)
article_type: original
author:
- first_name: Dashti
  full_name: Ali, Dashti
  last_name: Ali
- first_name: Aras
  full_name: Asaad, Aras
  last_name: Asaad
- first_name: Maria-Jose
  full_name: Jimenez, Maria-Jose
  last_name: Jimenez
- first_name: Vidit
  full_name: Nanda, Vidit
  last_name: Nanda
- first_name: Eduardo
  full_name: Paluzo-Hidalgo, Eduardo
  last_name: Paluzo-Hidalgo
- first_name: Manuel
  full_name: Soriano Trigueros, Manuel
  id: 15ebd7cf-15bf-11ee-aebd-bb4bb5121ea8
  last_name: Soriano Trigueros
  orcid: 0000-0003-2449-1433
citation:
  ama: Ali D, Asaad A, Jimenez M-J, Nanda V, Paluzo-Hidalgo E, Soriano Trigueros M.
    A survey of vectorization methods in topological data analysis. <i>IEEE Transactions
    on Pattern Analysis and Machine Intelligence</i>. 2023;45(12):14069-14080. doi:<a
    href="https://doi.org/10.1109/tpami.2023.3308391">10.1109/tpami.2023.3308391</a>
  apa: Ali, D., Asaad, A., Jimenez, M.-J., Nanda, V., Paluzo-Hidalgo, E., &#38; Soriano
    Trigueros, M. (2023). A survey of vectorization methods in topological data analysis.
    <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>. IEEE. <a
    href="https://doi.org/10.1109/tpami.2023.3308391">https://doi.org/10.1109/tpami.2023.3308391</a>
  chicago: Ali, Dashti, Aras Asaad, Maria-Jose Jimenez, Vidit Nanda, Eduardo Paluzo-Hidalgo,
    and Manuel Soriano Trigueros. “A Survey of Vectorization Methods in Topological
    Data Analysis.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    IEEE, 2023. <a href="https://doi.org/10.1109/tpami.2023.3308391">https://doi.org/10.1109/tpami.2023.3308391</a>.
  ieee: D. Ali, A. Asaad, M.-J. Jimenez, V. Nanda, E. Paluzo-Hidalgo, and M. Soriano
    Trigueros, “A survey of vectorization methods in topological data analysis,” <i>IEEE
    Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 45, no. 12.
    IEEE, pp. 14069–14080, 2023.
  ista: Ali D, Asaad A, Jimenez M-J, Nanda V, Paluzo-Hidalgo E, Soriano Trigueros
    M. 2023. A survey of vectorization methods in topological data analysis. IEEE
    Transactions on Pattern Analysis and Machine Intelligence. 45(12), 14069–14080.
  mla: Ali, Dashti, et al. “A Survey of Vectorization Methods in Topological Data
    Analysis.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 45, no. 12, IEEE, 2023, pp. 14069–80, doi:<a href="https://doi.org/10.1109/tpami.2023.3308391">10.1109/tpami.2023.3308391</a>.
  short: D. Ali, A. Asaad, M.-J. Jimenez, V. Nanda, E. Paluzo-Hidalgo, M. Soriano
    Trigueros, IEEE Transactions on Pattern Analysis and Machine Intelligence 45 (2023)
    14069–14080.
date_created: 2024-01-08T09:59:46Z
date_published: 2023-12-01T00:00:00Z
date_updated: 2025-09-09T14:08:56Z
day: '01'
ddc:
- '000'
department:
- _id: HeEd
doi: 10.1109/tpami.2023.3308391
external_id:
  isi:
  - '001104973300002'
file:
- access_level: open_access
  checksum: 465c28ef0b151b4b1fb47977ed5581ab
  content_type: application/pdf
  creator: dernst
  date_created: 2024-01-08T10:09:14Z
  date_updated: 2024-01-08T10:09:14Z
  file_id: '14740'
  file_name: 2023_IEEEToP_Ali.pdf
  file_size: 2370988
  relation: main_file
  success: 1
file_date_updated: 2024-01-08T10:09:14Z
has_accepted_license: '1'
intvolume: '        45'
isi: 1
issue: '12'
keyword:
- Applied Mathematics
- Artificial Intelligence
- Computational Theory and Mathematics
- Computer Vision and Pattern Recognition
- Software
language:
- iso: eng
month: '12'
oa: 1
oa_version: Published Version
page: 14069-14080
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
quality_controlled: '1'
scopus_import: '1'
status: public
title: A survey of vectorization methods in topological data analysis
tmp:
  image: /images/cc_by.png
  legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
  name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
  short: CC BY (4.0)
type: journal_article
user_id: 317138e5-6ab7-11ef-aa6d-ffef3953e345
volume: 45
year: '2023'
...
---
OA_place: repository
OA_type: green
_id: '18228'
abstract:
- lang: eng
  text: We introduce two constructions in geometric deep learning for 1) transporting
    orientation-dependent convolutional filters over a manifold in a continuous way
    and thereby defining a convolution operator that naturally incorporates the rotational
    effect of holonomy; and 2) allowing efficient evaluation of manifold convolution
    layers by sampling manifold valued random variables that center around a weighted
    diffusion mean. Both methods are inspired by stochastics on manifolds and geometric
    statistics, and provide examples of how stochastic methods – here horizontal frame
    bundle flows and non-linear bridge sampling schemes, can be used in geometric
    deep learning. We outline the theoretical foundation of the two methods, discuss
    their relation to Euclidean deep networks and existing methodology in geometric
    deep learning, and establish important properties of the proposed constructions.
article_processing_charge: No
article_type: original
arxiv: 1
author:
- first_name: Stefan
  full_name: Sommer, Stefan
  last_name: Sommer
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
citation:
  ama: Sommer S, Bronstein AM. Horizontal flows and manifold stochastics in geometric
    deep learning. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    2020;44(2):811-822. doi:<a href="https://doi.org/10.1109/tpami.2020.2994507">10.1109/tpami.2020.2994507</a>
  apa: Sommer, S., &#38; Bronstein, A. M. (2020). Horizontal flows and manifold stochastics
    in geometric deep learning. <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>. Institute of Electrical and Electronics Engineers. <a href="https://doi.org/10.1109/tpami.2020.2994507">https://doi.org/10.1109/tpami.2020.2994507</a>
  chicago: Sommer, Stefan, and Alex M. Bronstein. “Horizontal Flows and Manifold Stochastics
    in Geometric Deep Learning.” <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>. Institute of Electrical and Electronics Engineers, 2020. <a
    href="https://doi.org/10.1109/tpami.2020.2994507">https://doi.org/10.1109/tpami.2020.2994507</a>.
  ieee: S. Sommer and A. M. Bronstein, “Horizontal flows and manifold stochastics
    in geometric deep learning,” <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>, vol. 44, no. 2. Institute of Electrical and Electronics Engineers,
    pp. 811–822, 2020.
  ista: Sommer S, Bronstein AM. 2020. Horizontal flows and manifold stochastics in
    geometric deep learning. IEEE Transactions on Pattern Analysis and Machine Intelligence.
    44(2), 811–822.
  mla: Sommer, Stefan, and Alex M. Bronstein. “Horizontal Flows and Manifold Stochastics
    in Geometric Deep Learning.” <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>, vol. 44, no. 2, Institute of Electrical and Electronics Engineers,
    2020, pp. 811–22, doi:<a href="https://doi.org/10.1109/tpami.2020.2994507">10.1109/tpami.2020.2994507</a>.
  short: S. Sommer, A.M. Bronstein, IEEE Transactions on Pattern Analysis and Machine
    Intelligence 44 (2020) 811–822.
date_created: 2024-10-08T12:55:23Z
date_published: 2020-02-01T00:00:00Z
date_updated: 2024-10-15T06:56:47Z
day: '01'
doi: 10.1109/tpami.2020.2994507
extern: '1'
external_id:
  arxiv:
  - '1909.06397'
intvolume: '        44'
issue: '2'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://doi.org/10.48550/arXiv.1909.06397
month: '02'
oa: 1
oa_version: Preprint
page: 811-822
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: Institute of Electrical and Electronics Engineers
quality_controlled: '1'
scopus_import: '1'
status: public
title: Horizontal flows and manifold stochastics in geometric deep learning
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 44
year: '2020'
...
---
OA_type: closed access
_id: '18245'
abstract:
- lang: eng
  text: Intel® RealSense™ SR300 is a depth camera capable of providing a VGA-size
    depth map at 60 fps and 0.125mm depth resolution. In addition, it outputs an infrared
    VGA-resolution image and a 1080p color texture image at 30 fps. SR300 form-factor
    enables it to be integrated into small consumer products and as a front facing
    camera in laptops and Ultrabooks™. The SR300 depth camera is based on a coded-light
    technology where triangulation between projected patterns and images captured
    by a dedicated sensor is used to produce the depth map. Each projected line is
    coded by a special temporal optical code, that enables a dense depth map reconstruction
    from its reflection. The solid mechanical assembly of the camera allows it to
    stay calibrated throughout temperature and pressure changes, drops, and hits.
    In addition, active dynamic control maintains a calibrated depth output. An extended
    API LibRS released with the camera allows developers to integrate the camera in
    various applications. Algorithms for 3D scanning, facial analysis, hand gesture
    recognition, and tracking are within reach for applications using the SR300. In
    this paper, we describe the underlying technology, hardware, and algorithms of
    the SR300, as well as its calibration procedure, and outline some use cases. We
    believe that this paper will provide a full case study of a mass-produced depth
    sensing product and technology.
article_processing_charge: No
article_type: original
author:
- first_name: Aviad
  full_name: Zabatani, Aviad
  last_name: Zabatani
- first_name: Vitaly
  full_name: Surazhsky, Vitaly
  last_name: Surazhsky
- first_name: Erez
  full_name: Sperling, Erez
  last_name: Sperling
- first_name: Sagi Ben
  full_name: Moshe, Sagi Ben
  last_name: Moshe
- first_name: Ohad
  full_name: Menashe, Ohad
  last_name: Menashe
- first_name: David H.
  full_name: Silver, David H.
  last_name: Silver
- first_name: Zachi
  full_name: Karni, Zachi
  last_name: Karni
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
- first_name: Michael K
  full_name: Bronstein, Michael K
  last_name: Bronstein
- first_name: Ron
  full_name: Kimmel, Ron
  last_name: Kimmel
citation:
  ama: Zabatani A, Surazhsky V, Sperling E, et al. Intel® RealSense<sup>TM</sup> SR300
    coded light depth camera. <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>. 2020;42(10):2333-2345. doi:<a href="https://doi.org/10.1109/tpami.2019.2915841">10.1109/tpami.2019.2915841</a>
  apa: Zabatani, A., Surazhsky, V., Sperling, E., Moshe, S. B., Menashe, O., Silver,
    D. H., … Kimmel, R. (2020). Intel® RealSense<sup>TM</sup> SR300 coded light depth
    camera. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    Institute of Electrical and Electronics Engineers. <a href="https://doi.org/10.1109/tpami.2019.2915841">https://doi.org/10.1109/tpami.2019.2915841</a>
  chicago: Zabatani, Aviad, Vitaly Surazhsky, Erez Sperling, Sagi Ben Moshe, Ohad
    Menashe, David H. Silver, Zachi Karni, Alex M. Bronstein, Michael K Bronstein,
    and Ron Kimmel. “Intel® RealSense<sup>TM</sup> SR300 Coded Light Depth Camera.”
    <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>. Institute
    of Electrical and Electronics Engineers, 2020. <a href="https://doi.org/10.1109/tpami.2019.2915841">https://doi.org/10.1109/tpami.2019.2915841</a>.
  ieee: A. Zabatani <i>et al.</i>, “Intel® RealSense<sup>TM</sup> SR300 coded light
    depth camera,” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 42, no. 10. Institute of Electrical and Electronics Engineers, pp. 2333–2345,
    2020.
  ista: Zabatani A, Surazhsky V, Sperling E, Moshe SB, Menashe O, Silver DH, Karni
    Z, Bronstein AM, Bronstein MK, Kimmel R. 2020. Intel® RealSense<sup>TM</sup> SR300
    coded light depth camera. IEEE Transactions on Pattern Analysis and Machine Intelligence.
    42(10), 2333–2345.
  mla: Zabatani, Aviad, et al. “Intel® RealSense<sup>TM</sup> SR300 Coded Light Depth
    Camera.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 42, no. 10, Institute of Electrical and Electronics Engineers, 2020, pp.
    2333–45, doi:<a href="https://doi.org/10.1109/tpami.2019.2915841">10.1109/tpami.2019.2915841</a>.
  short: A. Zabatani, V. Surazhsky, E. Sperling, S.B. Moshe, O. Menashe, D.H. Silver,
    Z. Karni, A.M. Bronstein, M.K. Bronstein, R. Kimmel, IEEE Transactions on Pattern
    Analysis and Machine Intelligence 42 (2020) 2333–2345.
date_created: 2024-10-08T13:04:18Z
date_published: 2020-10-01T00:00:00Z
date_updated: 2024-10-15T09:40:01Z
day: '01'
doi: 10.1109/tpami.2019.2915841
extern: '1'
external_id:
  pmid:
  - '31094683'
intvolume: '        42'
issue: '10'
language:
- iso: eng
month: '10'
oa_version: None
page: 2333-2345
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: Institute of Electrical and Electronics Engineers
quality_controlled: '1'
scopus_import: '1'
status: public
title: Intel® RealSense™ SR300 coded light depth camera
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 42
year: '2020'
...
---
_id: '6554'
abstract:
- lang: eng
  text: Due to the importance of zero-shot learning, i.e. classifying images where
    there is a lack of labeled training data, the number of proposed approaches has
    recently increased steadily. We argue that it is time to take a step back and
    to analyze the status quo of the area. The purpose of this paper is three-fold.
    First, given the fact that there is no agreed upon zero-shot learning benchmark,
    we first define a new benchmark by unifying both the evaluation protocols and
    data splits of publicly available datasets used for this task. This is an important
    contribution as published results are often not comparable and sometimes even
    flawed due to, e.g. pre-training on zero-shot test classes. Moreover, we propose
    a new zero-shot learning dataset, the Animals with Attributes 2 (AWA2) dataset
    which we make publicly available both in terms of image features and the images
    themselves. Second, we compare and analyze a significant number of the state-of-the-art
    methods in depth, both in the classic zero-shot setting but also in the more realistic
    generalized zero-shot setting. Finally, we discuss in detail the limitations of
    the current status of the area which can be taken as a basis for advancing it.
article_processing_charge: No
article_type: original
arxiv: 1
author:
- first_name: Yongqin
  full_name: Xian, Yongqin
  last_name: Xian
- first_name: Christoph
  full_name: Lampert, Christoph
  id: 40C20FD2-F248-11E8-B48F-1D18A9856A87
  last_name: Lampert
  orcid: 0000-0002-4561-241X
- first_name: Bernt
  full_name: Schiele, Bernt
  last_name: Schiele
- first_name: Zeynep
  full_name: Akata, Zeynep
  last_name: Akata
citation:
  ama: Xian Y, Lampert C, Schiele B, Akata Z. Zero-shot learning - A comprehensive
    evaluation of the good, the bad and the ugly. <i>IEEE Transactions on Pattern
    Analysis and Machine Intelligence</i>. 2019;41(9):2251-2265. doi:<a href="https://doi.org/10.1109/tpami.2018.2857768">10.1109/tpami.2018.2857768</a>
  apa: Xian, Y., Lampert, C., Schiele, B., &#38; Akata, Z. (2019). Zero-shot learning
    - A comprehensive evaluation of the good, the bad and the ugly. <i>IEEE Transactions
    on Pattern Analysis and Machine Intelligence</i>. Institute of Electrical and
    Electronics Engineers. <a href="https://doi.org/10.1109/tpami.2018.2857768">https://doi.org/10.1109/tpami.2018.2857768</a>
  chicago: Xian, Yongqin, Christoph Lampert, Bernt Schiele, and Zeynep Akata. “Zero-Shot
    Learning - A Comprehensive Evaluation of the Good, the Bad and the Ugly.” <i>IEEE
    Transactions on Pattern Analysis and Machine Intelligence</i>. Institute of Electrical
    and Electronics Engineers, 2019. <a href="https://doi.org/10.1109/tpami.2018.2857768">https://doi.org/10.1109/tpami.2018.2857768</a>.
  ieee: Y. Xian, C. Lampert, B. Schiele, and Z. Akata, “Zero-shot learning - A comprehensive
    evaluation of the good, the bad and the ugly,” <i>IEEE Transactions on Pattern
    Analysis and Machine Intelligence</i>, vol. 41, no. 9. Institute of Electrical
    and Electronics Engineers, pp. 2251–2265, 2019.
  ista: Xian Y, Lampert C, Schiele B, Akata Z. 2019. Zero-shot learning - A comprehensive
    evaluation of the good, the bad and the ugly. IEEE Transactions on Pattern Analysis
    and Machine Intelligence. 41(9), 2251–2265.
  mla: Xian, Yongqin, et al. “Zero-Shot Learning - A Comprehensive Evaluation of the
    Good, the Bad and the Ugly.” <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>, vol. 41, no. 9, Institute of Electrical and Electronics Engineers,
    2019, pp. 2251–65, doi:<a href="https://doi.org/10.1109/tpami.2018.2857768">10.1109/tpami.2018.2857768</a>.
  short: Y. Xian, C. Lampert, B. Schiele, Z. Akata, IEEE Transactions on Pattern Analysis
    and Machine Intelligence 41 (2019) 2251–2265.
date_created: 2019-06-11T14:05:59Z
date_published: 2019-09-01T00:00:00Z
date_updated: 2024-12-11T11:49:58Z
day: '01'
department:
- _id: ChLa
doi: 10.1109/tpami.2018.2857768
external_id:
  arxiv:
  - '1707.00600'
  isi:
  - '000480343900015'
intvolume: '        41'
isi: 1
issue: '9'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://arxiv.org/abs/1707.00600
month: '09'
oa: 1
oa_version: Preprint
page: 2251 - 2265
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: Institute of Electrical and Electronics Engineers
quality_controlled: '1'
scopus_import: '1'
status: public
title: Zero-shot learning - A comprehensive evaluation of the good, the bad and the
  ugly
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 41
year: '2019'
...
---
_id: '703'
abstract:
- lang: eng
  text: We consider the NP-hard problem of MAP-inference for undirected discrete graphical
    models. We propose a polynomial time and practically efficient algorithm for finding
    a part of its optimal solution. Specifically, our algorithm marks some labels
    of the considered graphical model either as (i) optimal, meaning that they belong
    to all optimal solutions of the inference problem; (ii) non-optimal if they provably
    do not belong to any solution. With access to an exact solver of a linear programming
    relaxation to the MAP-inference problem, our algorithm marks the maximal possible
    (in a specified sense) number of labels. We also present a version of the algorithm,
    which has access to a suboptimal dual solver only and still can ensure the (non-)optimality
    for the marked labels, although the overall number of the marked labels may decrease.
    We propose an efficient implementation, which runs in time comparable to a single
    run of a suboptimal dual solver. Our method is well-scalable and shows state-of-the-art
    results on computational benchmarks from machine learning and computer vision.
article_processing_charge: No
arxiv: 1
author:
- first_name: Alexander
  full_name: Shekhovtsov, Alexander
  last_name: Shekhovtsov
- first_name: Paul
  full_name: Swoboda, Paul
  id: 446560C6-F248-11E8-B48F-1D18A9856A87
  last_name: Swoboda
- first_name: Bogdan
  full_name: Savchynskyy, Bogdan
  last_name: Savchynskyy
citation:
  ama: Shekhovtsov A, Swoboda P, Savchynskyy B. Maximum persistency via iterative
    relaxed inference with graphical models. <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>. 2018;40(7):1668-1682. doi:<a href="https://doi.org/10.1109/TPAMI.2017.2730884">10.1109/TPAMI.2017.2730884</a>
  apa: Shekhovtsov, A., Swoboda, P., &#38; Savchynskyy, B. (2018). Maximum persistency
    via iterative relaxed inference with graphical models. <i>IEEE Transactions on
    Pattern Analysis and Machine Intelligence</i>. IEEE. <a href="https://doi.org/10.1109/TPAMI.2017.2730884">https://doi.org/10.1109/TPAMI.2017.2730884</a>
  chicago: Shekhovtsov, Alexander, Paul Swoboda, and Bogdan Savchynskyy. “Maximum
    Persistency via Iterative Relaxed Inference with Graphical Models.” <i>IEEE Transactions
    on Pattern Analysis and Machine Intelligence</i>. IEEE, 2018. <a href="https://doi.org/10.1109/TPAMI.2017.2730884">https://doi.org/10.1109/TPAMI.2017.2730884</a>.
  ieee: A. Shekhovtsov, P. Swoboda, and B. Savchynskyy, “Maximum persistency via iterative
    relaxed inference with graphical models,” <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>, vol. 40, no. 7. IEEE, pp. 1668–1682, 2018.
  ista: Shekhovtsov A, Swoboda P, Savchynskyy B. 2018. Maximum persistency via iterative
    relaxed inference with graphical models. IEEE Transactions on Pattern Analysis
    and Machine Intelligence. 40(7), 1668–1682.
  mla: Shekhovtsov, Alexander, et al. “Maximum Persistency via Iterative Relaxed Inference
    with Graphical Models.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 40, no. 7, IEEE, 2018, pp. 1668–82, doi:<a href="https://doi.org/10.1109/TPAMI.2017.2730884">10.1109/TPAMI.2017.2730884</a>.
  short: A. Shekhovtsov, P. Swoboda, B. Savchynskyy, IEEE Transactions on Pattern
    Analysis and Machine Intelligence 40 (2018) 1668–1682.
corr_author: '1'
date_created: 2018-12-11T11:48:01Z
date_published: 2018-07-01T00:00:00Z
date_updated: 2026-04-16T09:54:52Z
day: '01'
department:
- _id: VlKo
doi: 10.1109/TPAMI.2017.2730884
external_id:
  arxiv:
  - '1508.07902'
  isi:
  - '000434294800010'
intvolume: '        40'
isi: 1
issue: '7'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://arxiv.org/abs/1508.07902
month: '07'
oa: 1
oa_version: Preprint
page: 1668-1682
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
publist_id: '6992'
quality_controlled: '1'
scopus_import: '1'
status: public
title: Maximum persistency via iterative relaxed inference with graphical models
type: journal_article
user_id: ba8df636-2132-11f1-aed0-ed93e2281fdd
volume: 40
year: '2018'
...
---
_id: '18415'
abstract:
- lang: eng
  text: Parsimony, including sparsity and low rank, has been shown to successfully
    model data in numerous machine learning and signal processing tasks. Traditionally,
    such modeling approaches rely on an iterative algorithm that minimizes an objective
    function with parsimony-promoting terms. The inherently sequential structure and
    data-dependent complexity and latency of iterative optimization constitute a major
    limitation in many applications requiring real-time performance or involving large-scale
    data. Another limitation encountered by these modeling techniques is the difficulty
    of their inclusion in discriminative learning scenarios. In this work, we propose
    to move the emphasis from the model to the pursuit algorithm, and develop a process-centric
    view of parsimonious modeling, in which a learned deterministic fixed-complexity
    pursuit process is used in lieu of iterative optimization. We show a principled
    way to construct learnable pursuit process architectures for structured sparse
    and robust low rank models, derived from the iteration of proximal descent algorithms.
    These architectures learn to approximate the exact parsimonious representation
    at a fraction of the complexity of the standard optimization methods. We also
    show that appropriate training regimes allow to naturally extend parsimonious
    models to discriminative settings. State-of-the-art results are demonstrated on
    several challenging problems in image and audio processing with several orders
    of magnitude speed-up compared to the exact optimization algorithms.
article_processing_charge: No
arxiv: 1
author:
- first_name: P.
  full_name: Sprechmann, P.
  last_name: Sprechmann
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
- first_name: G.
  full_name: Sapiro, G.
  last_name: Sapiro
citation:
  ama: Sprechmann P, Bronstein AM, Sapiro G. Learning efficient sparse and low rank
    models. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    2015;37(9):1821-1833. doi:<a href="https://doi.org/10.1109/tpami.2015.2392779">10.1109/tpami.2015.2392779</a>
  apa: Sprechmann, P., Bronstein, A. M., &#38; Sapiro, G. (2015). Learning efficient
    sparse and low rank models. <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>. IEEE. <a href="https://doi.org/10.1109/tpami.2015.2392779">https://doi.org/10.1109/tpami.2015.2392779</a>
  chicago: Sprechmann, P., Alex M. Bronstein, and G. Sapiro. “Learning Efficient Sparse
    and Low Rank Models.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    IEEE, 2015. <a href="https://doi.org/10.1109/tpami.2015.2392779">https://doi.org/10.1109/tpami.2015.2392779</a>.
  ieee: P. Sprechmann, A. M. Bronstein, and G. Sapiro, “Learning efficient sparse
    and low rank models,” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 37, no. 9. IEEE, pp. 1821–1833, 2015.
  ista: Sprechmann P, Bronstein AM, Sapiro G. 2015. Learning efficient sparse and
    low rank models. IEEE Transactions on Pattern Analysis and Machine Intelligence.
    37(9), 1821–1833.
  mla: Sprechmann, P., et al. “Learning Efficient Sparse and Low Rank Models.” <i>IEEE
    Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 37, no. 9,
    IEEE, 2015, pp. 1821–33, doi:<a href="https://doi.org/10.1109/tpami.2015.2392779">10.1109/tpami.2015.2392779</a>.
  short: P. Sprechmann, A.M. Bronstein, G. Sapiro, IEEE Transactions on Pattern Analysis
    and Machine Intelligence 37 (2015) 1821–1833.
date_created: 2024-10-15T11:20:55Z
date_published: 2015-09-01T00:00:00Z
date_updated: 2024-12-18T11:40:35Z
day: '01'
doi: 10.1109/tpami.2015.2392779
extern: '1'
external_id:
  arxiv:
  - '1212.3631'
  pmid:
  - '26353129'
intvolume: '        37'
issue: '9'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://doi.org/10.48550/arXiv.1212.3631
month: '09'
oa: 1
oa_version: Preprint
page: 1821-1833
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
quality_controlled: '1'
scopus_import: '1'
status: public
title: Learning efficient sparse and low rank models
type: journal_article
user_id: 3E5EF7F0-F248-11E8-B48F-1D18A9856A87
volume: 37
year: '2015'
...
---
_id: '18416'
abstract:
- lang: eng
  text: We construct an extension of spectral and diffusion geometry to multiple modalities
    through simultaneous diagonalization of Laplacian matrices. This naturally extends
    classical data analysis tools based on spectral geometry, such as diffusion maps
    and spectral clustering. We provide several synthetic and real examples of manifold
    learning, object classification, and clustering, showing that the joint spectral
    geometry better captures the inherent structure of multi-modal data. We also show
    the relation of many previous approaches for multimodal manifold analysis to our
    framework.
article_processing_charge: No
author:
- first_name: Davide
  full_name: Eynard, Davide
  last_name: Eynard
- first_name: Artiom
  full_name: Kovnatsky, Artiom
  last_name: Kovnatsky
- first_name: Michael M.
  full_name: Bronstein, Michael M.
  last_name: Bronstein
- first_name: Klaus
  full_name: Glashoff, Klaus
  last_name: Glashoff
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
citation:
  ama: Eynard D, Kovnatsky A, Bronstein MM, Glashoff K, Bronstein AM. Multimodal manifold
    snalysis by simultaneous diagonalization of Laplacians. <i>IEEE Transactions on
    Pattern Analysis and Machine Intelligence</i>. 2015;37(12):2505-2517. doi:<a href="https://doi.org/10.1109/tpami.2015.2408348">10.1109/tpami.2015.2408348</a>
  apa: Eynard, D., Kovnatsky, A., Bronstein, M. M., Glashoff, K., &#38; Bronstein,
    A. M. (2015). Multimodal manifold snalysis by simultaneous diagonalization of
    Laplacians. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    IEEE. <a href="https://doi.org/10.1109/tpami.2015.2408348">https://doi.org/10.1109/tpami.2015.2408348</a>
  chicago: Eynard, Davide, Artiom Kovnatsky, Michael M. Bronstein, Klaus Glashoff,
    and Alex M. Bronstein. “Multimodal Manifold Snalysis by Simultaneous Diagonalization
    of Laplacians.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    IEEE, 2015. <a href="https://doi.org/10.1109/tpami.2015.2408348">https://doi.org/10.1109/tpami.2015.2408348</a>.
  ieee: D. Eynard, A. Kovnatsky, M. M. Bronstein, K. Glashoff, and A. M. Bronstein,
    “Multimodal manifold snalysis by simultaneous diagonalization of Laplacians,”
    <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 37,
    no. 12. IEEE, pp. 2505–2517, 2015.
  ista: Eynard D, Kovnatsky A, Bronstein MM, Glashoff K, Bronstein AM. 2015. Multimodal
    manifold snalysis by simultaneous diagonalization of Laplacians. IEEE Transactions
    on Pattern Analysis and Machine Intelligence. 37(12), 2505–2517.
  mla: Eynard, Davide, et al. “Multimodal Manifold Snalysis by Simultaneous Diagonalization
    of Laplacians.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 37, no. 12, IEEE, 2015, pp. 2505–17, doi:<a href="https://doi.org/10.1109/tpami.2015.2408348">10.1109/tpami.2015.2408348</a>.
  short: D. Eynard, A. Kovnatsky, M.M. Bronstein, K. Glashoff, A.M. Bronstein, IEEE
    Transactions on Pattern Analysis and Machine Intelligence 37 (2015) 2505–2517.
date_created: 2024-10-15T11:20:55Z
date_published: 2015-12-01T00:00:00Z
date_updated: 2024-12-12T14:08:46Z
day: '01'
doi: 10.1109/tpami.2015.2408348
extern: '1'
external_id:
  pmid:
  - '26539854'
intvolume: '        37'
issue: '12'
language:
- iso: eng
month: '12'
oa_version: None
page: 2505-2517
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
quality_controlled: '1'
scopus_import: '1'
status: public
title: Multimodal manifold snalysis by simultaneous diagonalization of Laplacians
type: journal_article
user_id: 3E5EF7F0-F248-11E8-B48F-1D18A9856A87
volume: 37
year: '2015'
...
---
_id: '18413'
abstract:
- lang: eng
  text: Informative and discriminative feature descriptors play a fundamental role
    in deformable shape analysis. For example, they have been successfully employed
    in correspondence, registration, and retrieval tasks. In recent years, significant
    attention has been devoted to descriptors obtained from the spectral decomposition
    of the Laplace-Beltrami operator associated with the shape. Notable examples in
    this family are the heat kernel signature (HKS) and the recently introduced wave
    kernel signature (WKS). The Laplacian-based descriptors achieve state-of-the-art
    performance in numerous shape analysis tasks; they are computationally efficient,
    isometry-invariant by construction, and can gracefully cope with a variety of
    transformations. In this paper, we formulate a generic family of parametric spectral
    descriptors. We argue that to be optimized for a specific task, the descriptor
    should take into account the statistics of the corpus of shapes to which it is
    applied (the "signal") and those of the class of transformations to which it is
    made insensitive (the "noise"). While such statistics are hard to model axiomatically,
    they can be learned from examples. Following the spirit of the Wiener filter in
    signal processing, we show a learning scheme for the construction of optimized
    spectral descriptors and relate it to Mahalanobis metric learning. The superiority
    of the proposed approach in generating correspondences is demonstrated on synthetic
    and scanned human figures. We also show that the learned descriptors are robust
    enough to be learned on synthetic data and transferred successfully to scanned
    shapes.
article_processing_charge: No
author:
- first_name: R.
  full_name: Litman, R.
  last_name: Litman
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
citation:
  ama: Litman R, Bronstein AM. Learning spectral descriptors for deformable shape
    correspondence. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    2014;36(1):171-180. doi:<a href="https://doi.org/10.1109/tpami.2013.148">10.1109/tpami.2013.148</a>
  apa: Litman, R., &#38; Bronstein, A. M. (2014). Learning spectral descriptors for
    deformable shape correspondence. <i>IEEE Transactions on Pattern Analysis and
    Machine Intelligence</i>. IEEE. <a href="https://doi.org/10.1109/tpami.2013.148">https://doi.org/10.1109/tpami.2013.148</a>
  chicago: Litman, R., and Alex M. Bronstein. “Learning Spectral Descriptors for Deformable
    Shape Correspondence.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    IEEE, 2014. <a href="https://doi.org/10.1109/tpami.2013.148">https://doi.org/10.1109/tpami.2013.148</a>.
  ieee: R. Litman and A. M. Bronstein, “Learning spectral descriptors for deformable
    shape correspondence,” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 36, no. 1. IEEE, pp. 171–180, 2014.
  ista: Litman R, Bronstein AM. 2014. Learning spectral descriptors for deformable
    shape correspondence. IEEE Transactions on Pattern Analysis and Machine Intelligence.
    36(1), 171–180.
  mla: Litman, R., and Alex M. Bronstein. “Learning Spectral Descriptors for Deformable
    Shape Correspondence.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 36, no. 1, IEEE, 2014, pp. 171–80, doi:<a href="https://doi.org/10.1109/tpami.2013.148">10.1109/tpami.2013.148</a>.
  short: R. Litman, A.M. Bronstein, IEEE Transactions on Pattern Analysis and Machine
    Intelligence 36 (2014) 171–180.
date_created: 2024-10-15T11:20:55Z
date_published: 2014-01-01T00:00:00Z
date_updated: 2024-12-12T12:42:56Z
day: '01'
doi: 10.1109/tpami.2013.148
extern: '1'
external_id:
  pmid:
  - '24231874'
intvolume: '        36'
issue: '1'
language:
- iso: eng
month: '01'
oa_version: None
page: 171-180
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
quality_controlled: '1'
scopus_import: '1'
status: public
title: Learning spectral descriptors for deformable shape correspondence
type: journal_article
user_id: 3E5EF7F0-F248-11E8-B48F-1D18A9856A87
volume: 36
year: '2014'
...
---
_id: '18414'
abstract:
- lang: eng
  text: We introduce an efficient computational framework for hashing data belonging
    to multiple modalities into a single representation space where they become mutually
    comparable. The proposed approach is based on a novel coupled siamese neural network
    architecture and allows unified treatment of intra- and inter-modality similarity
    learning. Unlike existing cross-modality similarity learning approaches, our hashing
    functions are not limited to binarized linear projections and can assume arbitrarily
    complex forms. We show experimentally that our method significantly outperforms
    state-of-the-art hashing approaches on multimedia retrieval tasks.
article_processing_charge: No
arxiv: 1
author:
- first_name: Jonathan
  full_name: Masci, Jonathan
  last_name: Masci
- first_name: Michael M.
  full_name: Bronstein, Michael M.
  last_name: Bronstein
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
- first_name: Jurgen
  full_name: Schmidhuber, Jurgen
  last_name: Schmidhuber
citation:
  ama: Masci J, Bronstein MM, Bronstein AM, Schmidhuber J. Multimodal similarity-preserving
    hashing. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    2014;36(4):824-830. doi:<a href="https://doi.org/10.1109/tpami.2013.225">10.1109/tpami.2013.225</a>
  apa: Masci, J., Bronstein, M. M., Bronstein, A. M., &#38; Schmidhuber, J. (2014).
    Multimodal similarity-preserving hashing. <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>. IEEE. <a href="https://doi.org/10.1109/tpami.2013.225">https://doi.org/10.1109/tpami.2013.225</a>
  chicago: Masci, Jonathan, Michael M. Bronstein, Alex M. Bronstein, and Jurgen Schmidhuber.
    “Multimodal Similarity-Preserving Hashing.” <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>. IEEE, 2014. <a href="https://doi.org/10.1109/tpami.2013.225">https://doi.org/10.1109/tpami.2013.225</a>.
  ieee: J. Masci, M. M. Bronstein, A. M. Bronstein, and J. Schmidhuber, “Multimodal
    similarity-preserving hashing,” <i>IEEE Transactions on Pattern Analysis and Machine
    Intelligence</i>, vol. 36, no. 4. IEEE, pp. 824–830, 2014.
  ista: Masci J, Bronstein MM, Bronstein AM, Schmidhuber J. 2014. Multimodal similarity-preserving
    hashing. IEEE Transactions on Pattern Analysis and Machine Intelligence. 36(4),
    824–830.
  mla: Masci, Jonathan, et al. “Multimodal Similarity-Preserving Hashing.” <i>IEEE
    Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 36, no. 4,
    IEEE, 2014, pp. 824–30, doi:<a href="https://doi.org/10.1109/tpami.2013.225">10.1109/tpami.2013.225</a>.
  short: J. Masci, M.M. Bronstein, A.M. Bronstein, J. Schmidhuber, IEEE Transactions
    on Pattern Analysis and Machine Intelligence 36 (2014) 824–830.
date_created: 2024-10-15T11:20:55Z
date_published: 2014-04-01T00:00:00Z
date_updated: 2024-12-12T13:04:27Z
day: '01'
doi: 10.1109/tpami.2013.225
extern: '1'
external_id:
  arxiv:
  - '1207.1522'
  pmid:
  - '26353203'
intvolume: '        36'
issue: '4'
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://doi.org/10.48550/arXiv.1207.1522
month: '04'
oa: 1
oa_version: Preprint
page: 824-830
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 1939-3539
  issn:
  - 0162-8828
publication_status: published
publisher: IEEE
quality_controlled: '1'
scopus_import: '1'
status: public
title: Multimodal similarity-preserving hashing
type: journal_article
user_id: 3E5EF7F0-F248-11E8-B48F-1D18A9856A87
volume: 36
year: '2014'
...
---
_id: '18412'
abstract:
- lang: eng
  text: SIFT-like local feature descriptors are ubiquitously employed in computer
    vision applications such as content-based retrieval, video analysis, copy detection,
    object recognition, photo tourism, and 3D reconstruction. Feature descriptors
    can be designed to be invariant to certain classes of photometric and geometric
    transformations, in particular, affine and intensity scale transformations. However,
    real transformations that an image can undergo can only be approximately modeled
    in this way, and thus most descriptors are only approximately invariant in practice.
    Second, descriptors are usually high dimensional (e.g., SIFT is represented as
    a 128--dimensional vector). In large-scale retrieval and matching problems, this
    can pose challenges in storing and retrieving descriptor data. We map the descriptor
    vectors into the Hamming space in which the Hamming metric is used to compare
    the resulting representations. This way, we reduce the size of the descriptors
    by representing them as short binary strings and learn descriptor invariance from
    examples. We show extensive experimental validation, demonstrating the advantage
    of the proposed approach.
article_processing_charge: No
article_type: original
author:
- first_name: C.
  full_name: Strecha, C.
  last_name: Strecha
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
- first_name: M. M.
  full_name: Bronstein, M. M.
  last_name: Bronstein
- first_name: P.
  full_name: Fua, P.
  last_name: Fua
citation:
  ama: 'Strecha C, Bronstein AM, Bronstein MM, Fua P. LDAHash: Improved matching with
    smaller descriptors. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    2012;34(1):66-78. doi:<a href="https://doi.org/10.1109/tpami.2011.103">10.1109/tpami.2011.103</a>'
  apa: 'Strecha, C., Bronstein, A. M., Bronstein, M. M., &#38; Fua, P. (2012). LDAHash:
    Improved matching with smaller descriptors. <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>. Institute of Electrical and Electronics Engineers.
    <a href="https://doi.org/10.1109/tpami.2011.103">https://doi.org/10.1109/tpami.2011.103</a>'
  chicago: 'Strecha, C., Alex M. Bronstein, M. M. Bronstein, and P. Fua. “LDAHash:
    Improved Matching with Smaller Descriptors.” <i>IEEE Transactions on Pattern Analysis
    and Machine Intelligence</i>. Institute of Electrical and Electronics Engineers,
    2012. <a href="https://doi.org/10.1109/tpami.2011.103">https://doi.org/10.1109/tpami.2011.103</a>.'
  ieee: 'C. Strecha, A. M. Bronstein, M. M. Bronstein, and P. Fua, “LDAHash: Improved
    matching with smaller descriptors,” <i>IEEE Transactions on Pattern Analysis and
    Machine Intelligence</i>, vol. 34, no. 1. Institute of Electrical and Electronics
    Engineers, pp. 66–78, 2012.'
  ista: 'Strecha C, Bronstein AM, Bronstein MM, Fua P. 2012. LDAHash: Improved matching
    with smaller descriptors. IEEE Transactions on Pattern Analysis and Machine Intelligence.
    34(1), 66–78.'
  mla: 'Strecha, C., et al. “LDAHash: Improved Matching with Smaller Descriptors.”
    <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 34,
    no. 1, Institute of Electrical and Electronics Engineers, 2012, pp. 66–78, doi:<a
    href="https://doi.org/10.1109/tpami.2011.103">10.1109/tpami.2011.103</a>.'
  short: C. Strecha, A.M. Bronstein, M.M. Bronstein, P. Fua, IEEE Transactions on
    Pattern Analysis and Machine Intelligence 34 (2012) 66–78.
date_created: 2024-10-15T11:20:54Z
date_published: 2012-01-01T00:00:00Z
date_updated: 2024-11-12T08:34:48Z
day: '01'
doi: 10.1109/tpami.2011.103
extern: '1'
external_id:
  pmid:
  - '21576750 '
intvolume: '        34'
issue: '1'
language:
- iso: eng
month: '01'
oa_version: None
page: 66-78
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  eissn:
  - 2160-9292
  issn:
  - 0162-8828
publication_status: published
publisher: Institute of Electrical and Electronics Engineers
quality_controlled: '1'
scopus_import: '1'
status: public
title: 'LDAHash: Improved matching with smaller descriptors'
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 34
year: '2012'
...
---
OA_type: closed access
_id: '18411'
abstract:
- lang: eng
  text: Recent works have shown the use of diffusion geometry for various pattern
    recognition applications, including nonrigid shape analysis. In this paper, we
    introduce spectral shape distance as a general framework for distribution-based
    shape similarity and show that two recent methods for shape similarity due to
    Rustamov and Mahmoudi and Sapiro are particular cases thereof.
article_processing_charge: No
article_type: original
author:
- first_name: Michael M
  full_name: Bronstein, Michael M
  last_name: Bronstein
- first_name: Alexander
  full_name: Bronstein, Alexander
  id: 58f3726e-7cba-11ef-ad8b-e6e8cb3904e6
  last_name: Bronstein
  orcid: 0000-0001-9699-8730
citation:
  ama: Bronstein MM, Bronstein AM. Shape recognition with spectral distances. <i>IEEE
    Transactions on Pattern Analysis and Machine Intelligence</i>. 2011;33(5):1065-1071.
    doi:<a href="https://doi.org/10.1109/tpami.2010.210">10.1109/tpami.2010.210</a>
  apa: Bronstein, M. M., &#38; Bronstein, A. M. (2011). Shape recognition with spectral
    distances. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    Institute of Electrical and Electronics Engineers. <a href="https://doi.org/10.1109/tpami.2010.210">https://doi.org/10.1109/tpami.2010.210</a>
  chicago: Bronstein, Michael M, and Alex M. Bronstein. “Shape Recognition with Spectral
    Distances.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>.
    Institute of Electrical and Electronics Engineers, 2011. <a href="https://doi.org/10.1109/tpami.2010.210">https://doi.org/10.1109/tpami.2010.210</a>.
  ieee: M. M. Bronstein and A. M. Bronstein, “Shape recognition with spectral distances,”
    <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>, vol. 33,
    no. 5. Institute of Electrical and Electronics Engineers, pp. 1065–1071, 2011.
  ista: Bronstein MM, Bronstein AM. 2011. Shape recognition with spectral distances.
    IEEE Transactions on Pattern Analysis and Machine Intelligence. 33(5), 1065–1071.
  mla: Bronstein, Michael M., and Alex M. Bronstein. “Shape Recognition with Spectral
    Distances.” <i>IEEE Transactions on Pattern Analysis and Machine Intelligence</i>,
    vol. 33, no. 5, Institute of Electrical and Electronics Engineers, 2011, pp. 1065–71,
    doi:<a href="https://doi.org/10.1109/tpami.2010.210">10.1109/tpami.2010.210</a>.
  short: M.M. Bronstein, A.M. Bronstein, IEEE Transactions on Pattern Analysis and
    Machine Intelligence 33 (2011) 1065–1071.
date_created: 2024-10-15T11:20:54Z
date_published: 2011-05-01T00:00:00Z
date_updated: 2024-10-22T08:02:31Z
day: '01'
doi: 10.1109/tpami.2010.210
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page: 1065-1071
pmid: 1
publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
publication_identifier:
  issn:
  - 0162-8828
publication_status: published
publisher: Institute of Electrical and Electronics Engineers
quality_controlled: '1'
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status: public
title: Shape recognition with spectral distances
type: journal_article
user_id: 2DF688A6-F248-11E8-B48F-1D18A9856A87
volume: 33
year: '2011'
...
