[{"date_published":"2002-12-01T00:00:00Z","main_file_link":[{"open_access":"1","url":"http://doi.org/10.6028/jres.107.052"}],"title":"Implications of polishing techniques in quantitative X-ray microanalysis","intvolume":"       107","citation":{"ama":"Remond G, Nockolds C, Phillips M, Roques-Carmes C. Implications of polishing techniques in quantitative X-ray microanalysis. <i>Journal of Research of the National Institute of Standards and Technology</i>. 2002;107(6):639-662. doi:<a href=\"https://doi.org/10.6028/jres.107.052\">10.6028/jres.107.052</a>","ista":"Remond G, Nockolds C, Phillips M, Roques-Carmes C. 2002. Implications of polishing techniques in quantitative X-ray microanalysis. Journal of Research of the National Institute of Standards and Technology. 107(6), 639–662.","apa":"Remond, G., Nockolds, C., Phillips, M., &#38; Roques-Carmes, C. (2002). Implications of polishing techniques in quantitative X-ray microanalysis. <i>Journal of Research of the National Institute of Standards and Technology</i>. National Institute of Standards and Technology. <a href=\"https://doi.org/10.6028/jres.107.052\">https://doi.org/10.6028/jres.107.052</a>","mla":"Remond, G., et al. “Implications of Polishing Techniques in Quantitative X-Ray Microanalysis.” <i>Journal of Research of the National Institute of Standards and Technology</i>, vol. 107, no. 6, National Institute of Standards and Technology, 2002, pp. 639–62, doi:<a href=\"https://doi.org/10.6028/jres.107.052\">10.6028/jres.107.052</a>.","short":"G. Remond, C. Nockolds, M. Phillips, C. Roques-Carmes, Journal of Research of the National Institute of Standards and Technology 107 (2002) 639–662.","ieee":"G. Remond, C. Nockolds, M. Phillips, and C. Roques-Carmes, “Implications of polishing techniques in quantitative X-ray microanalysis,” <i>Journal of Research of the National Institute of Standards and Technology</i>, vol. 107, no. 6. National Institute of Standards and Technology, pp. 639–662, 2002.","chicago":"Remond, G., C. Nockolds, M. Phillips, and Charles Roques-Carmes. “Implications of Polishing Techniques in Quantitative X-Ray Microanalysis.” <i>Journal of Research of the National Institute of Standards and Technology</i>. National Institute of Standards and Technology, 2002. <a href=\"https://doi.org/10.6028/jres.107.052\">https://doi.org/10.6028/jres.107.052</a>."},"type":"journal_article","month":"12","status":"public","publication_identifier":{"issn":["1044-677X"]},"volume":107,"page":"639-662","keyword":["abrasive wear","bound abrasives","chemical-mechanical polishing","loose abrasives","polishing","surface and subsurface damage","x-ray microanalysis."],"year":"2002","issue":"6","date_updated":"2026-05-05T07:50:26Z","abstract":[{"lang":"eng","text":"Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are presented to illustrate the effects of surface topography, surface and subsurface composition and induced lattice defects on the accuracy of quantitative x-ray microanalysis of mineral materials with the electron probe microanalyzer (EPMA)."}],"fulldoi":"https://doi.org/10.6028/jres.107.052","doi":"10.6028/jres.107.052","publication_status":"published","external_id":{"pmid":["27446758"]},"publication":"Journal of Research of the National Institute of Standards and Technology","oa_version":"Published Version","_id":"21646","publisher":"National Institute of Standards and Technology","article_processing_charge":"No","day":"01","language":[{"iso":"eng"}],"user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","pmid":1,"author":[{"full_name":"Remond, G.","first_name":"G.","last_name":"Remond"},{"full_name":"Nockolds, C.","first_name":"C.","last_name":"Nockolds"},{"full_name":"Phillips, M.","first_name":"M.","last_name":"Phillips"},{"full_name":"Roques-Carmes, Charles","first_name":"Charles","last_name":"Roques-Carmes","id":"e2e68fc9-6505-11ef-a541-eb4e72cc3e82"}],"article_type":"original","OA_place":"publisher","extern":"1","date_created":"2026-03-30T12:22:48Z","oa":1}]