[{"publication_identifier":{"eissn":["2515-7647"]},"type":"journal_article","file_date_updated":"2026-03-02T09:05:53Z","arxiv":1,"month":"03","abstract":[{"lang":"eng","text":"Through digital imaging, microscopy has evolved from primarily being a means for visual observation of life at the micro- and nano-scale, to a quantitative tool with ever-increasing resolution and throughput. Artificial intelligence, deep neural networks, and machine learning (ML) are all niche terms describing computational methods that have gained a pivotal role in microscopy-based research over the past decade. This Roadmap encompasses key aspects of how ML is applied to microscopy image data, with the aim of gaining scientific knowledge by improved image quality, automated detection, segmentation, classification and tracking of objects, and efficient merging of information from multiple imaging modalities. We aim to give the reader an overview of the key developments and an understanding of possibilities and limitations of ML for microscopy. It will be of interest to a wide cross-disciplinary audience in the physical sciences and life sciences."}],"external_id":{"arxiv":["2303.03793"]},"title":"Roadmap on deep learning for microscopy","date_created":"2026-03-01T23:01:39Z","license":"https://creativecommons.org/licenses/by/4.0/","doi":"10.1088/2515-7647/ae0fd1","oa_version":"Published Version","article_processing_charge":"Yes","department":[{"_id":"ScWa"}],"intvolume":"         8","publication_status":"published","DOAJ_listed":"1","language":[{"iso":"eng"}],"date_published":"2026-03-01T00:00:00Z","_id":"21370","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"article_type":"original","quality_controlled":"1","oa":1,"PlanS_conform":"1","volume":8,"issue":"1","day":"01","OA_place":"publisher","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","publication":"Journal of Physics: Photonics","status":"public","OA_type":"gold","ddc":["530"],"article_number":"012501","citation":{"short":"G. Volpe, C. Wählby, L. Tian, M. Hecht, A. Yakimovich, K. Monakhova, L. Waller, I.F. Sbalzarini, C.A. Metzler, M. Xie, K. Zhang, I.C. Lenton, H. Rubinsztein-Dunlop, D. Brunner, B. Bai, A. Ozcan, D. Midtvedt, H. Wang, T. Li, N. Sladoje, J. Lindblad, J.T. Smith, M. Ochoa, M. Barroso, X. Intes, T. Qiu, L.Y. Yu, S. You, Y. Liu, M.A. Ziatdinov, S.V. Kalinin, A. Sheridan, U. Manor, E. Nehme, O. Goldenberg, Y. Shechtman, H.K. Moberg, C. Langhammer, B. Špačková, S. Helgadottir, B. Midtvedt, A. Argun, T. Thalheim, F. Cichos, S. Bo, L. Hubatsch, J. Pineda, C. Manzo, H. Bachimanchi, E. Selander, A. Homs-Corbera, M. Fränzl, K. De Haan, Y. Rivenson, Z. Korczak, C.B. Adiels, M. Mijalkov, D. Veréb, Y.W. Chang, J.B. Pereira, D. Matuszewski, G. Kylberg, I.M. Sintorn, J.C. Caicedo, B.A. Cimini, M.A. Lediju Bell, B.M. Saraiva, G. Jacquemet, R. Henriques, W. Ouyang, T. Le, E. Gómez-De-Mariscal, D. Sage, A. Muñoz-Barrutia, E.J. Lindqvist, J. Bergman, Journal of Physics: Photonics 8 (2026).","ista":"Volpe G, Wählby C, Tian L, Hecht M, Yakimovich A, Monakhova K, Waller L, Sbalzarini IF, Metzler CA, Xie M, Zhang K, Lenton IC, Rubinsztein-Dunlop H, Brunner D, Bai B, Ozcan A, Midtvedt D, Wang H, Li T, Sladoje N, Lindblad J, Smith JT, Ochoa M, Barroso M, Intes X, Qiu T, Yu LY, You S, Liu Y, Ziatdinov MA, Kalinin SV, Sheridan A, Manor U, Nehme E, Goldenberg O, Shechtman Y, Moberg HK, Langhammer C, Špačková B, Helgadottir S, Midtvedt B, Argun A, Thalheim T, Cichos F, Bo S, Hubatsch L, Pineda J, Manzo C, Bachimanchi H, Selander E, Homs-Corbera A, Fränzl M, De Haan K, Rivenson Y, Korczak Z, Adiels CB, Mijalkov M, Veréb D, Chang YW, Pereira JB, Matuszewski D, Kylberg G, Sintorn IM, Caicedo JC, Cimini BA, Lediju Bell MA, Saraiva BM, Jacquemet G, Henriques R, Ouyang W, Le T, Gómez-De-Mariscal E, Sage D, Muñoz-Barrutia A, Lindqvist EJ, Bergman J. 2026. Roadmap on deep learning for microscopy. Journal of Physics: Photonics. 8(1), 012501.","chicago":"Volpe, Giovanni, Carolina Wählby, Lei Tian, Michael Hecht, Artur Yakimovich, Kristina Monakhova, Laura Waller, et al. “Roadmap on Deep Learning for Microscopy.” <i>Journal of Physics: Photonics</i>. IOP Publishing, 2026. <a href=\"https://doi.org/10.1088/2515-7647/ae0fd1\">https://doi.org/10.1088/2515-7647/ae0fd1</a>.","ieee":"G. Volpe <i>et al.</i>, “Roadmap on deep learning for microscopy,” <i>Journal of Physics: Photonics</i>, vol. 8, no. 1. IOP Publishing, 2026.","apa":"Volpe, G., Wählby, C., Tian, L., Hecht, M., Yakimovich, A., Monakhova, K., … Bergman, J. (2026). Roadmap on deep learning for microscopy. <i>Journal of Physics: Photonics</i>. IOP Publishing. <a href=\"https://doi.org/10.1088/2515-7647/ae0fd1\">https://doi.org/10.1088/2515-7647/ae0fd1</a>","mla":"Volpe, Giovanni, et al. “Roadmap on Deep Learning for Microscopy.” <i>Journal of Physics: Photonics</i>, vol. 8, no. 1, 012501, IOP Publishing, 2026, doi:<a href=\"https://doi.org/10.1088/2515-7647/ae0fd1\">10.1088/2515-7647/ae0fd1</a>.","ama":"Volpe G, Wählby C, Tian L, et al. Roadmap on deep learning for microscopy. <i>Journal of Physics: Photonics</i>. 2026;8(1). doi:<a href=\"https://doi.org/10.1088/2515-7647/ae0fd1\">10.1088/2515-7647/ae0fd1</a>"},"file":[{"content_type":"application/pdf","file_size":16789781,"checksum":"172720f1f0c5c9d06a282e52023a0030","access_level":"open_access","date_updated":"2026-03-02T09:05:53Z","success":1,"date_created":"2026-03-02T09:05:53Z","file_name":"2026_JPhysPhotonics_Volpe.pdf","creator":"dernst","file_id":"21375","relation":"main_file"}],"publisher":"IOP Publishing","scopus_import":"1","has_accepted_license":"1","date_updated":"2026-03-23T13:18:11Z","author":[{"first_name":"Giovanni","last_name":"Volpe","full_name":"Volpe, Giovanni"},{"last_name":"Wählby","first_name":"Carolina","full_name":"Wählby, Carolina"},{"full_name":"Tian, Lei","last_name":"Tian","first_name":"Lei"},{"full_name":"Hecht, Michael","first_name":"Michael","last_name":"Hecht"},{"full_name":"Yakimovich, Artur","last_name":"Yakimovich","first_name":"Artur"},{"first_name":"Kristina","last_name":"Monakhova","full_name":"Monakhova, Kristina"},{"full_name":"Waller, Laura","first_name":"Laura","last_name":"Waller"},{"full_name":"Sbalzarini, Ivo F.","first_name":"Ivo F.","last_name":"Sbalzarini"},{"full_name":"Metzler, Christopher A.","last_name":"Metzler","first_name":"Christopher A."},{"last_name":"Xie","first_name":"Mingyang","full_name":"Xie, Mingyang"},{"first_name":"Kevin","last_name":"Zhang","full_name":"Zhang, Kevin"},{"id":"a550210f-223c-11ec-8182-e2d45e817efb","orcid":"0000-0002-5010-6984","full_name":"Lenton, Isaac C","last_name":"Lenton","first_name":"Isaac C"},{"last_name":"Rubinsztein-Dunlop","first_name":"Halina","full_name":"Rubinsztein-Dunlop, Halina"},{"first_name":"Daniel","last_name":"Brunner","full_name":"Brunner, Daniel"},{"full_name":"Bai, Bijie","first_name":"Bijie","last_name":"Bai"},{"last_name":"Ozcan","first_name":"Aydogan","full_name":"Ozcan, Aydogan"},{"last_name":"Midtvedt","first_name":"Daniel","full_name":"Midtvedt, Daniel"},{"last_name":"Wang","first_name":"Hao","full_name":"Wang, Hao"},{"full_name":"Li, Tongyu","last_name":"Li","first_name":"Tongyu"},{"first_name":"Nataša","last_name":"Sladoje","full_name":"Sladoje, Nataša"},{"full_name":"Lindblad, Joakim","first_name":"Joakim","last_name":"Lindblad"},{"first_name":"Jason T.","last_name":"Smith","full_name":"Smith, Jason T."},{"first_name":"Marien","last_name":"Ochoa","full_name":"Ochoa, Marien"},{"full_name":"Barroso, Margarida","last_name":"Barroso","first_name":"Margarida"},{"last_name":"Intes","first_name":"Xavier","full_name":"Intes, Xavier"},{"full_name":"Qiu, Tong","first_name":"Tong","last_name":"Qiu"},{"first_name":"Li Yu","last_name":"Yu","full_name":"Yu, Li Yu"},{"last_name":"You","first_name":"Sixian","full_name":"You, Sixian"},{"full_name":"Liu, Yongtao","last_name":"Liu","first_name":"Yongtao"},{"full_name":"Ziatdinov, Maxim A.","first_name":"Maxim A.","last_name":"Ziatdinov"},{"full_name":"Kalinin, Sergei V.","first_name":"Sergei V.","last_name":"Kalinin"},{"full_name":"Sheridan, Arlo","first_name":"Arlo","last_name":"Sheridan"},{"full_name":"Manor, Uri","last_name":"Manor","first_name":"Uri"},{"first_name":"Elias","last_name":"Nehme","full_name":"Nehme, Elias"},{"full_name":"Goldenberg, Ofri","first_name":"Ofri","last_name":"Goldenberg"},{"last_name":"Shechtman","first_name":"Yoav","full_name":"Shechtman, Yoav"},{"full_name":"Moberg, Henrik K.","last_name":"Moberg","first_name":"Henrik K."},{"full_name":"Langhammer, Christoph","last_name":"Langhammer","first_name":"Christoph"},{"full_name":"Špačková, Barbora","first_name":"Barbora","last_name":"Špačková"},{"first_name":"Saga","last_name":"Helgadottir","full_name":"Helgadottir, Saga"},{"last_name":"Midtvedt","first_name":"Benjamin","full_name":"Midtvedt, Benjamin"},{"first_name":"Aykut","last_name":"Argun","full_name":"Argun, Aykut"},{"first_name":"Tobias","last_name":"Thalheim","full_name":"Thalheim, Tobias"},{"last_name":"Cichos","first_name":"Frank","full_name":"Cichos, Frank"},{"last_name":"Bo","first_name":"Stefano","full_name":"Bo, Stefano"},{"last_name":"Hubatsch","first_name":"Lars","full_name":"Hubatsch, Lars"},{"first_name":"Jesus","last_name":"Pineda","full_name":"Pineda, Jesus"},{"full_name":"Manzo, Carlo","last_name":"Manzo","first_name":"Carlo"},{"full_name":"Bachimanchi, Harshith","last_name":"Bachimanchi","first_name":"Harshith"},{"first_name":"Erik","last_name":"Selander","full_name":"Selander, Erik"},{"last_name":"Homs-Corbera","first_name":"Antoni","full_name":"Homs-Corbera, Antoni"},{"full_name":"Fränzl, Martin","last_name":"Fränzl","first_name":"Martin"},{"full_name":"De Haan, Kevin","first_name":"Kevin","last_name":"De Haan"},{"full_name":"Rivenson, Yair","last_name":"Rivenson","first_name":"Yair"},{"full_name":"Korczak, Zofia","first_name":"Zofia","last_name":"Korczak"},{"full_name":"Adiels, Caroline Beck","last_name":"Adiels","first_name":"Caroline Beck"},{"full_name":"Mijalkov, Mite","last_name":"Mijalkov","first_name":"Mite"},{"full_name":"Veréb, Dániel","first_name":"Dániel","last_name":"Veréb"},{"full_name":"Chang, Yu Wei","first_name":"Yu Wei","last_name":"Chang"},{"full_name":"Pereira, Joana B.","first_name":"Joana B.","last_name":"Pereira"},{"last_name":"Matuszewski","first_name":"Damian","full_name":"Matuszewski, Damian"},{"full_name":"Kylberg, Gustaf","last_name":"Kylberg","first_name":"Gustaf"},{"full_name":"Sintorn, Ida Maria","last_name":"Sintorn","first_name":"Ida Maria"},{"full_name":"Caicedo, Juan C.","last_name":"Caicedo","first_name":"Juan C."},{"last_name":"Cimini","first_name":"Beth A.","full_name":"Cimini, Beth A."},{"last_name":"Lediju Bell","first_name":"Muyinatu A.","full_name":"Lediju Bell, Muyinatu A."},{"first_name":"Bruno M.","last_name":"Saraiva","full_name":"Saraiva, Bruno M."},{"last_name":"Jacquemet","first_name":"Guillaume","full_name":"Jacquemet, Guillaume"},{"first_name":"Ricardo","last_name":"Henriques","full_name":"Henriques, Ricardo"},{"last_name":"Ouyang","first_name":"Wei","full_name":"Ouyang, Wei"},{"full_name":"Le, Trang","last_name":"Le","first_name":"Trang"},{"full_name":"Gómez-De-Mariscal, Estibaliz","last_name":"Gómez-De-Mariscal","first_name":"Estibaliz"},{"last_name":"Sage","first_name":"Daniel","full_name":"Sage, Daniel"},{"last_name":"Muñoz-Barrutia","first_name":"Arrate","full_name":"Muñoz-Barrutia, Arrate"},{"first_name":"Ebba Josefson","last_name":"Lindqvist","full_name":"Lindqvist, Ebba Josefson"},{"full_name":"Bergman, Johanna","first_name":"Johanna","last_name":"Bergman"}],"year":"2026"},{"doi":"10.1002/admi.202500521","date_created":"2025-09-07T22:01:33Z","oa_version":"Published Version","article_processing_charge":"Yes","title":"A duality between surface charge and work function in scanning Kelvin probe microscopy","department":[{"_id":"ScWa"},{"_id":"NanoFab"}],"acknowledgement":"This project received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (Grant agreement No. 949120). This research was supported by the Scientific Service Units of The Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop, Nanofabrication Facility, Scientific Computing Facility, and Lab Support Facility. The authors wish to thank Dmytro Rak and Juan Carlos Sobarzo for letting us use their equipment. The authors wish to thank Evgeniia Volobueva for advice in preparing PFIB samples. The authors wish to thank the contributions of the whole Waitukaitis group for useful discussions and feedback.","corr_author":"1","publication_identifier":{"eissn":["2196-7350"]},"external_id":{"arxiv":["2506.07187"],"isi":["001560163400001"]},"project":[{"_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa","grant_number":"949120","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","call_identifier":"H2020"}],"arxiv":1,"month":"10","file_date_updated":"2025-12-30T09:31:11Z","type":"journal_article","abstract":[{"text":"Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to probe the surface charge on insulating surfaces. In both cases, relating the measured potential to the underlying signal is non-trivial. Here, general relationships are derived between the measured SKPM voltage and the underlying source, revealing either can be cast as a convolution with an appropriately scaled point spread function (PSF). For charge that exists on a thin insulating layer above a conductor, the PSF has the same shape as what would occur from a work-function variation alone, differing by a simple scaling factor. This relationship is confirmed by: (1) backing it out from finite-element simulations of work-function and charge signals, and (2) experimentally comparing the measured PSF from a small work-function target to that from a small charge spot. This scaling factor is further validated by comparing SKPM charge measurements with Faraday cup measurements for highly charged samples from contact-charging experiments. These results highlight a heretofore unappreciated connection between SKPM voltage and charge signals, offering a rigorous recipe to extract either from experimental data.","lang":"eng"}],"date_published":"2025-10-01T00:00:00Z","_id":"20295","isi":1,"intvolume":"        12","publication_status":"published","DOAJ_listed":"1","language":[{"iso":"eng"}],"issue":"19","PlanS_conform":"1","volume":12,"user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","OA_place":"publisher","day":"01","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"oa":1,"article_type":"original","quality_controlled":"1","acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"NanoFab"},{"_id":"ScienComp"},{"_id":"LifeSc"}],"date_updated":"2025-12-30T09:31:25Z","author":[{"orcid":"0000-0002-5010-6984","id":"a550210f-223c-11ec-8182-e2d45e817efb","full_name":"Lenton, Isaac C","last_name":"Lenton","first_name":"Isaac C"},{"orcid":"0000-0003-0463-5794","id":"6313aec0-15b2-11ec-abd3-ed67d16139af","full_name":"Pertl, Felix","first_name":"Felix","last_name":"Pertl"},{"orcid":"0000-0001-7180-6050","id":"3CD37A82-F248-11E8-B48F-1D18A9856A87","first_name":"Lubuna B","last_name":"Shafeek","full_name":"Shafeek, Lubuna B"},{"id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-2299-3176","last_name":"Waitukaitis","first_name":"Scott R","full_name":"Waitukaitis, Scott R"}],"year":"2025","ddc":["530"],"OA_type":"gold","citation":{"mla":"Lenton, Isaac C., et al. “A Duality between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy.” <i>Advanced Materials Interfaces</i>, vol. 12, no. 19, e00521, Wiley, 2025, doi:<a href=\"https://doi.org/10.1002/admi.202500521\">10.1002/admi.202500521</a>.","apa":"Lenton, I. C., Pertl, F., Shafeek, L. B., &#38; Waitukaitis, S. R. (2025). A duality between surface charge and work function in scanning Kelvin probe microscopy. <i>Advanced Materials Interfaces</i>. Wiley. <a href=\"https://doi.org/10.1002/admi.202500521\">https://doi.org/10.1002/admi.202500521</a>","ieee":"I. C. Lenton, F. Pertl, L. B. Shafeek, and S. R. Waitukaitis, “A duality between surface charge and work function in scanning Kelvin probe microscopy,” <i>Advanced Materials Interfaces</i>, vol. 12, no. 19. Wiley, 2025.","ama":"Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. A duality between surface charge and work function in scanning Kelvin probe microscopy. <i>Advanced Materials Interfaces</i>. 2025;12(19). doi:<a href=\"https://doi.org/10.1002/admi.202500521\">10.1002/admi.202500521</a>","short":"I.C. Lenton, F. Pertl, L.B. Shafeek, S.R. Waitukaitis, Advanced Materials Interfaces 12 (2025).","chicago":"Lenton, Isaac C, Felix Pertl, Lubuna B Shafeek, and Scott R Waitukaitis. “A Duality between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy.” <i>Advanced Materials Interfaces</i>. Wiley, 2025. <a href=\"https://doi.org/10.1002/admi.202500521\">https://doi.org/10.1002/admi.202500521</a>.","ista":"Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2025. A duality between surface charge and work function in scanning Kelvin probe microscopy. Advanced Materials Interfaces. 12(19), e00521."},"article_number":"e00521","publication":"Advanced Materials Interfaces","status":"public","file":[{"date_created":"2025-12-30T09:31:11Z","success":1,"access_level":"open_access","date_updated":"2025-12-30T09:31:11Z","file_size":1830117,"content_type":"application/pdf","checksum":"906fcc7733be8ce8a83600427b82cd5a","relation":"main_file","file_id":"20908","creator":"dernst","file_name":"2025_AdvMaterialsInterfaces_Lenton.pdf"}],"publisher":"Wiley","has_accepted_license":"1","scopus_import":"1","ec_funded":1},{"year":"2025","author":[{"first_name":"Felix","last_name":"Pertl","full_name":"Pertl, Felix","orcid":"0000-0003-0463-5794","id":"6313aec0-15b2-11ec-abd3-ed67d16139af"},{"orcid":"0000-0002-5010-6984","id":"a550210f-223c-11ec-8182-e2d45e817efb","full_name":"Lenton, Isaac C","last_name":"Lenton","first_name":"Isaac C"},{"full_name":"Cramer, Tobias","first_name":"Tobias","last_name":"Cramer"},{"orcid":"0000-0002-2299-3176","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","first_name":"Scott R","last_name":"Waitukaitis","full_name":"Waitukaitis, Scott R"}],"acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"NanoFab"},{"_id":"LifeSc"}],"date_updated":"2025-12-01T14:57:53Z","scopus_import":"1","has_accepted_license":"1","ec_funded":1,"file":[{"relation":"main_file","file_id":"20522","creator":"dernst","file_name":"2025_PhysReviewLetters_Pertl.pdf","date_created":"2025-10-23T09:32:31Z","success":1,"date_updated":"2025-10-23T09:32:31Z","access_level":"open_access","content_type":"application/pdf","checksum":"7e45e89b8db0b7f01e63185c68e4b0f9","file_size":1692251}],"publisher":"American Physical Society","article_number":"146202","ddc":["530"],"OA_type":"hybrid","citation":{"mla":"Pertl, Felix, et al. “No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces.” <i>Physical Review Letters</i>, vol. 135, no. 14, 146202, American Physical Society, 2025, doi:<a href=\"https://doi.org/10.1103/lcsm-xxty\">10.1103/lcsm-xxty</a>.","ama":"Pertl F, Lenton IC, Cramer T, Waitukaitis SR. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. <i>Physical Review Letters</i>. 2025;135(14). doi:<a href=\"https://doi.org/10.1103/lcsm-xxty\">10.1103/lcsm-xxty</a>","apa":"Pertl, F., Lenton, I. C., Cramer, T., &#38; Waitukaitis, S. R. (2025). No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. <i>Physical Review Letters</i>. American Physical Society. <a href=\"https://doi.org/10.1103/lcsm-xxty\">https://doi.org/10.1103/lcsm-xxty</a>","ieee":"F. Pertl, I. C. Lenton, T. Cramer, and S. R. Waitukaitis, “No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces,” <i>Physical Review Letters</i>, vol. 135, no. 14. American Physical Society, 2025.","short":"F. Pertl, I.C. Lenton, T. Cramer, S.R. Waitukaitis, Physical Review Letters 135 (2025).","chicago":"Pertl, Felix, Isaac C Lenton, Tobias Cramer, and Scott R Waitukaitis. “No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces.” <i>Physical Review Letters</i>. American Physical Society, 2025. <a href=\"https://doi.org/10.1103/lcsm-xxty\">https://doi.org/10.1103/lcsm-xxty</a>.","ista":"Pertl F, Lenton IC, Cramer T, Waitukaitis SR. 2025. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. Physical Review Letters. 135(14), 146202."},"status":"public","publication":"Physical Review Letters","OA_place":"publisher","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","day":"30","issue":"14","volume":135,"PlanS_conform":"1","oa":1,"quality_controlled":"1","article_type":"original","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"isi":1,"_id":"20481","related_material":{"record":[{"relation":"research_data","id":"20523","status":"public"}]},"date_published":"2025-09-30T00:00:00Z","language":[{"iso":"eng"}],"publication_status":"published","intvolume":"       135","department":[{"_id":"ScWa"}],"article_processing_charge":"Yes (via OA deal)","oa_version":"Published Version","date_created":"2025-10-16T13:13:29Z","doi":"10.1103/lcsm-xxty","title":"No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces","project":[{"call_identifier":"H2020","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","grant_number":"949120","_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa"}],"external_id":{"isi":["001587263900003"],"arxiv":["2502.12718"]},"abstract":[{"text":"Kelvin probe force microscopy (KPFM) is widely used in stationary and dynamic studies of contact electrification. An obvious question that connects these two has been overlooked: when are charge dynamics too fast for stationary studies to be meaningful? Using a rapid transfer system to quickly perform KPFM after contact, we find the dynamics are too fast in all but the best insulators. Our data further suggest that dynamics are caused by bulk as opposed to surface conductivity, and that charge-transfer heterogeneity is less prevalent than previously suggested.","lang":"eng"}],"arxiv":1,"type":"journal_article","month":"09","file_date_updated":"2025-10-23T09:32:31Z","corr_author":"1","acknowledgement":"This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (Grant agreement No. 949120). This research was supported by the Scientific Service Units of The Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop, the Nanofabrication Facility and Lab Support Facility.","publication_identifier":{"issn":["0031-9007"],"eissn":["1079-7114"]}},{"language":[{"iso":"eng"}],"intvolume":"       112","publication_status":"published","_id":"20847","date_published":"2025-12-01T00:00:00Z","month":"12","file_date_updated":"2025-12-29T11:15:42Z","arxiv":1,"type":"journal_article","abstract":[{"text":"We report on an experimental active matter system with motion restricted to four cardinal directions. Our particles are magnetite-doped colloidal spheres driven by the Quincke electrorotational instability. The absence of a magnetic field (|𝑩|=0) leads to circular trajectories interspersed with short spontaneous runs. Intermediate fields (|𝑩|≲20mT) linearize the motion along the axis perpendicular to 𝑩. At high magnetic fields, we observe the surprising emergence of a second, distinct linearization along the axis parallel to 𝑩. With numerical simulations, we show that this behavior can be explained by anisotropic magnetic susceptibility.","lang":"eng"}],"external_id":{"arxiv":["2508.05643"]},"project":[{"name":"MixQUIckR: Mixing with QUIncke Rollers","grant_number":"E 298","_id":"bd8eede5-d553-11ed-ba76-eaded0d13485"},{"_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa","grant_number":"949120","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","call_identifier":"H2020"}],"publication_identifier":{"issn":["2470-0045"],"eissn":["2470-0053"]},"acknowledgement":"This research was funded in whole or in part by the Austrian Science Fund (FWF) [Grant DOI: 10.55776/ESP298]. This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (Grant\r\nAgreement No. 949120). This research was supported by the Scientific Service Units of The Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop, Nanofabrication Facility, Scientific Computing Facility, and Lab Support Facility. We wish to acknowledge the crucial contributions of Alexandre Morin in getting the project off the ground, and Jack Merrin for creating the SU-8 deposition protocol used in the construction of our\r\ncells. We also wish to thank Kimberley Modic and Hamza Nasir for their work on single-particle characterization. ","corr_author":"1","department":[{"_id":"ScWa"}],"title":"Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter","doi":"10.1103/1ss8-31rb","date_created":"2025-12-21T23:01:34Z","oa_version":"Published Version","article_processing_charge":"Yes (via OA deal)","file":[{"content_type":"application/pdf","file_size":2131491,"checksum":"d593e933f976c3f3cde37ad66539d57d","date_updated":"2025-12-29T11:15:42Z","access_level":"open_access","success":1,"date_created":"2025-12-29T11:15:42Z","creator":"dernst","file_name":"2025_PhysReviewE_Fitzgerald.pdf","relation":"main_file","file_id":"20862"}],"publisher":"American Physical Society","has_accepted_license":"1","scopus_import":"1","ec_funded":1,"publication":"Physical Review E","status":"public","citation":{"ieee":"E. Fitzgerald, C. Clavaud, D. Das, I. C. Lenton, and S. R. Waitukaitis, “Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter,” <i>Physical Review E</i>, vol. 112, no. 6. American Physical Society, 2025.","apa":"Fitzgerald, E., Clavaud, C., Das, D., Lenton, I. C., &#38; Waitukaitis, S. R. (2025). Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter. <i>Physical Review E</i>. American Physical Society. <a href=\"https://doi.org/10.1103/1ss8-31rb\">https://doi.org/10.1103/1ss8-31rb</a>","ama":"Fitzgerald E, Clavaud C, Das D, Lenton IC, Waitukaitis SR. Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter. <i>Physical Review E</i>. 2025;112(6). doi:<a href=\"https://doi.org/10.1103/1ss8-31rb\">10.1103/1ss8-31rb</a>","mla":"Fitzgerald, Eavan, et al. “Rolling at Right Angles: Magnetic Anisotropy Enables Dual-Anisotropic Active Matter.” <i>Physical Review E</i>, vol. 112, no. 6, 065418, American Physical Society, 2025, doi:<a href=\"https://doi.org/10.1103/1ss8-31rb\">10.1103/1ss8-31rb</a>.","ista":"Fitzgerald E, Clavaud C, Das D, Lenton IC, Waitukaitis SR. 2025. Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter. Physical Review E. 112(6), 065418.","chicago":"Fitzgerald, Eavan, Cécile Clavaud, Debasish Das, Isaac C Lenton, and Scott R Waitukaitis. “Rolling at Right Angles: Magnetic Anisotropy Enables Dual-Anisotropic Active Matter.” <i>Physical Review E</i>. American Physical Society, 2025. <a href=\"https://doi.org/10.1103/1ss8-31rb\">https://doi.org/10.1103/1ss8-31rb</a>.","short":"E. Fitzgerald, C. Clavaud, D. Das, I.C. Lenton, S.R. Waitukaitis, Physical Review E 112 (2025)."},"article_number":"065418","OA_type":"hybrid","ddc":["530"],"author":[{"id":"2df8ab8f-080d-11ed-979a-bfe651ca3afa","last_name":"Fitzgerald","first_name":"Eavan","full_name":"Fitzgerald, Eavan"},{"full_name":"Clavaud, Cécile","first_name":"Cécile","last_name":"Clavaud","orcid":"0000-0002-1843-3803","id":"5f654c5d-04a1-11eb-ab36-ba9ffec58bd8"},{"last_name":"Das","first_name":"Debasish","full_name":"Das, Debasish"},{"full_name":"Lenton, Isaac C","first_name":"Isaac C","last_name":"Lenton","orcid":"0000-0002-5010-6984","id":"a550210f-223c-11ec-8182-e2d45e817efb"},{"full_name":"Waitukaitis, Scott R","last_name":"Waitukaitis","first_name":"Scott R","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-2299-3176"}],"year":"2025","date_updated":"2025-12-29T11:19:34Z","acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"NanoFab"},{"_id":"ScienComp"},{"_id":"LifeSc"}],"article_type":"original","quality_controlled":"1","oa":1,"tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"day":"01","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","OA_place":"publisher","PlanS_conform":"1","volume":112,"issue":"6"},{"department":[{"_id":"ZhAl"},{"_id":"CaMu"},{"_id":"ScWa"}],"date_created":"2025-11-30T23:02:07Z","doi":"10.1103/5xd9-4tjj","oa_version":"Published Version","article_processing_charge":"Yes (via OA deal)","title":"Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air","external_id":{"arxiv":["2507.17591"]},"project":[{"_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","grant_number":"949120","call_identifier":"H2020"},{"name":"Organization of CLoUdS, and implications of Tropical  cyclones and for the Energetics of the tropics, in current and waRming climate","grant_number":"805041","_id":"629205d8-2b32-11ec-9570-e1356ff73576","call_identifier":"H2020"}],"arxiv":1,"month":"11","type":"journal_article","file_date_updated":"2025-12-01T08:19:46Z","abstract":[{"lang":"eng","text":"Optical tweezers are widely used as a highly sensitive tool to measure forces on micron-scale particles. One such application is the measurement of the electric charge of a particle, which can be done with high precision in liquids, air, or vacuum. We experimentally investigate how the trapping laser itself can electrically charge such a particle, in our case a ∼1  μ⁢m SiO2 sphere in air. We model the charging mechanism as a two-photon process which reproduces the experimental data with high fidelity."}],"acknowledgement":"We thank Todor Asenov and Abdulhamid Baghdadi for their outstanding technical support and Dr. Michael Gleichweit and Mercede Azizbaig Mohajer for the helpful discussions. This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (Grant Agreements No. 949120 and No. 805041) and the Swiss National Science Foundation (SNSF, Project No. 200021-236446). This research was supported by the Scientific Service Units of the Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop and the Scientific Computing service unit.","corr_author":"1","publication_identifier":{"eissn":["1079-7114"],"issn":["0031-9007"]},"_id":"20705","related_material":{"link":[{"relation":"press_release","url":"https://ista.ac.at/en/news/trapping-particles-to-explain-lightning/","description":"News on ISTA website"}]},"date_published":"2025-11-21T00:00:00Z","language":[{"iso":"eng"}],"intvolume":"       135","publication_status":"published","user_id":"ba8df636-2132-11f1-aed0-ed93e2281fdd","OA_place":"publisher","day":"21","issue":"21","PlanS_conform":"1","volume":135,"oa":1,"article_type":"original","quality_controlled":"1","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"author":[{"full_name":"Stöllner, Andrea","last_name":"Stöllner","first_name":"Andrea","id":"4bdcf7f6-eb97-11eb-a6c2-9981bbdc3bed","orcid":"0000-0002-0464-8440"},{"full_name":"Lenton, Isaac C","last_name":"Lenton","first_name":"Isaac C","orcid":"0000-0002-5010-6984","id":"a550210f-223c-11ec-8182-e2d45e817efb"},{"orcid":"0000-0003-0393-5525","id":"37D278BC-F248-11E8-B48F-1D18A9856A87","last_name":"Volosniev","first_name":"Artem","full_name":"Volosniev, Artem"},{"last_name":"Millen","first_name":"James","full_name":"Millen, James"},{"last_name":"Shibuya","first_name":"Renjiro","full_name":"Shibuya, Renjiro"},{"first_name":"Hisao","last_name":"Ishii","full_name":"Ishii, Hisao"},{"last_name":"Rak","first_name":"Dmytro","full_name":"Rak, Dmytro","id":"70313b46-47c2-11ec-9e88-cd79101918fe"},{"full_name":"Alpichshev, Zhanybek","last_name":"Alpichshev","first_name":"Zhanybek","id":"45E67A2A-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-7183-5203"},{"first_name":"Grégory","last_name":"David","full_name":"David, Grégory"},{"full_name":"Signorell, Ruth","first_name":"Ruth","last_name":"Signorell"},{"full_name":"Muller, Caroline J","last_name":"Muller","first_name":"Caroline J","orcid":"0000-0001-5836-5350","id":"f978ccb0-3f7f-11eb-b193-b0e2bd13182b"},{"full_name":"Waitukaitis, Scott R","first_name":"Scott R","last_name":"Waitukaitis","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-2299-3176"}],"year":"2025","acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"ScienComp"}],"date_updated":"2026-04-28T13:09:27Z","publisher":"American Physical Society","file":[{"relation":"main_file","file_id":"20717","creator":"dernst","file_name":"2025_PhysReviewLetters_Stoellner.pdf","date_created":"2025-12-01T08:19:46Z","success":1,"access_level":"open_access","date_updated":"2025-12-01T08:19:46Z","file_size":1761373,"checksum":"a5f76b1230cc7b039ecd0dbd6f99e775","content_type":"application/pdf"}],"scopus_import":"1","ec_funded":1,"has_accepted_license":"1","citation":{"ista":"Stöllner A, Lenton IC, Volosniev A, Millen J, Shibuya R, Ishii H, Rak D, Alpichshev Z, David G, Signorell R, Muller CJ, Waitukaitis SR. 2025. Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air. Physical Review Letters. 135(21), 218202.","chicago":"Stöllner, Andrea, Isaac C Lenton, Artem Volosniev, James Millen, Renjiro Shibuya, Hisao Ishii, Dmytro Rak, et al. “Using Optical Tweezers to Simultaneously Trap, Charge, and Measure the Charge of a Microparticle in Air.” <i>Physical Review Letters</i>. American Physical Society, 2025. <a href=\"https://doi.org/10.1103/5xd9-4tjj\">https://doi.org/10.1103/5xd9-4tjj</a>.","short":"A. Stöllner, I.C. Lenton, A. Volosniev, J. Millen, R. Shibuya, H. Ishii, D. Rak, Z. Alpichshev, G. David, R. Signorell, C.J. Muller, S.R. Waitukaitis, Physical Review Letters 135 (2025).","mla":"Stöllner, Andrea, et al. “Using Optical Tweezers to Simultaneously Trap, Charge, and Measure the Charge of a Microparticle in Air.” <i>Physical Review Letters</i>, vol. 135, no. 21, 218202, American Physical Society, 2025, doi:<a href=\"https://doi.org/10.1103/5xd9-4tjj\">10.1103/5xd9-4tjj</a>.","ama":"Stöllner A, Lenton IC, Volosniev A, et al. Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air. <i>Physical Review Letters</i>. 2025;135(21). doi:<a href=\"https://doi.org/10.1103/5xd9-4tjj\">10.1103/5xd9-4tjj</a>","apa":"Stöllner, A., Lenton, I. C., Volosniev, A., Millen, J., Shibuya, R., Ishii, H., … Waitukaitis, S. R. (2025). Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air. <i>Physical Review Letters</i>. American Physical Society. <a href=\"https://doi.org/10.1103/5xd9-4tjj\">https://doi.org/10.1103/5xd9-4tjj</a>","ieee":"A. Stöllner <i>et al.</i>, “Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air,” <i>Physical Review Letters</i>, vol. 135, no. 21. American Physical Society, 2025."},"OA_type":"hybrid","article_number":"218202","ddc":["530","550"],"publication":"Physical Review Letters","status":"public"},{"license":"https://creativecommons.org/licenses/by-nc-nd/4.0/","doi":"10.1063/5.0215151","date_created":"2024-08-04T22:01:21Z","oa_version":"Published Version","article_processing_charge":"No","title":"Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging","department":[{"_id":"ScWa"},{"_id":"NanoFab"}],"acknowledgement":"This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (Grant Agreement No. 949120). This research was supported by the Scientific Service Units of the Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop, Nanofabrication Facility, Scientific Computing Facility, and Lab Support Facility. The authors wish to thank Dmytro Rak and Juan Carlos Sobarzo for letting us use their equipment. The authors wish to thank the contributions of the whole Waitukaitis Group for useful discussions and feedback.","corr_author":"1","publication_identifier":{"issn":["0021-8979"],"eissn":["1089-7550"]},"external_id":{"isi":["001281681100003"]},"project":[{"call_identifier":"H2020","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","grant_number":"949120","_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa"}],"file_date_updated":"2024-08-05T08:19:58Z","month":"07","type":"journal_article","abstract":[{"text":"Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work function, topology, surface charge density, or combinations thereof. Regardless of the underlying signal source, SKPM results in a voltage image, which is spatially distorted due to the finite size of the probe, long-range electrostatic interactions, mechanical and electrical noise, and the finite response time of the electronics. In order to recover the underlying signal, it is necessary to deconvolve the measurement with an appropriate point spread function (PSF) that accounts the aforementioned distortions, but determining this PSF is difficult. Here, we describe how such PSFs can be determined experimentally and show how they can be used to recover the underlying information of interest. We first consider the physical principles that enable SKPM and discuss how these affect the system PSF. We then show how one can experimentally measure PSFs by looking at well-defined features, and that these compare well to simulated PSFs, provided scans are performed extremely slowly and carefully. Next, we work at realistic scan speeds and show that the idealized PSFs fail to capture temporal distortions in the scan direction. While simulating PSFs for these situations would be quite challenging, we show that measuring PSFs with similar scan conditions works well. Our approach clarifies the basic principles and inherent challenges to SKPM measurements and gives practical methods to improve results.","lang":"eng"}],"date_published":"2024-07-28T00:00:00Z","_id":"17373","isi":1,"intvolume":"       136","publication_status":"published","language":[{"iso":"eng"}],"issue":"4","volume":136,"user_id":"317138e5-6ab7-11ef-aa6d-ffef3953e345","day":"28","tmp":{"name":"Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)","short":"CC BY-NC-ND (4.0)","image":"/images/cc_by_nc_nd.png","legal_code_url":"https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode"},"oa":1,"article_type":"original","quality_controlled":"1","acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"NanoFab"},{"_id":"LifeSc"},{"_id":"ScienComp"}],"date_updated":"2025-09-08T08:47:42Z","author":[{"last_name":"Lenton","first_name":"Isaac C","full_name":"Lenton, Isaac C","id":"a550210f-223c-11ec-8182-e2d45e817efb","orcid":"0000-0002-5010-6984"},{"orcid":"0000-0003-0463-5794","id":"6313aec0-15b2-11ec-abd3-ed67d16139af","first_name":"Felix","last_name":"Pertl","full_name":"Pertl, Felix"},{"id":"3CD37A82-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0001-7180-6050","first_name":"Lubuna B","last_name":"Shafeek","full_name":"Shafeek, Lubuna B"},{"orcid":"0000-0002-2299-3176","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","full_name":"Waitukaitis, Scott R","first_name":"Scott R","last_name":"Waitukaitis"}],"year":"2024","article_number":"045305","citation":{"chicago":"Lenton, Isaac C, Felix Pertl, Lubuna B Shafeek, and Scott R Waitukaitis. “Beyond the Blur: Using Experimentally Determined Point Spread Functions to Improve Scanning Kelvin Probe Imaging.” <i>Journal of Applied Physics</i>. AIP Publishing, 2024. <a href=\"https://doi.org/10.1063/5.0215151\">https://doi.org/10.1063/5.0215151</a>.","short":"I.C. Lenton, F. Pertl, L.B. Shafeek, S.R. Waitukaitis, Journal of Applied Physics 136 (2024).","ista":"Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2024. Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging. Journal of Applied Physics. 136(4), 045305.","mla":"Lenton, Isaac C., et al. “Beyond the Blur: Using Experimentally Determined Point Spread Functions to Improve Scanning Kelvin Probe Imaging.” <i>Journal of Applied Physics</i>, vol. 136, no. 4, 045305, AIP Publishing, 2024, doi:<a href=\"https://doi.org/10.1063/5.0215151\">10.1063/5.0215151</a>.","ama":"Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging. <i>Journal of Applied Physics</i>. 2024;136(4). doi:<a href=\"https://doi.org/10.1063/5.0215151\">10.1063/5.0215151</a>","apa":"Lenton, I. C., Pertl, F., Shafeek, L. B., &#38; Waitukaitis, S. R. (2024). Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging. <i>Journal of Applied Physics</i>. AIP Publishing. <a href=\"https://doi.org/10.1063/5.0215151\">https://doi.org/10.1063/5.0215151</a>","ieee":"I. C. Lenton, F. Pertl, L. B. Shafeek, and S. R. Waitukaitis, “Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging,” <i>Journal of Applied Physics</i>, vol. 136, no. 4. AIP Publishing, 2024."},"ddc":["530"],"publication":"Journal of Applied Physics","status":"public","publisher":"AIP Publishing","file":[{"access_level":"open_access","date_updated":"2024-08-05T08:19:58Z","date_created":"2024-08-05T08:19:58Z","success":1,"checksum":"6141d05cd68d540a7446dce9490975db","content_type":"application/pdf","file_size":2537502,"file_name":"2024_JourApplPhysics_Lenton.pdf","creator":"dernst","file_id":"17386","relation":"main_file"}],"ec_funded":1,"has_accepted_license":"1","scopus_import":"1"},{"publication_status":"published","language":[{"iso":"eng"}],"date_published":"2023-04-23T00:00:00Z","_id":"14864","acknowledgement":"This project has received funding from the European Research Council (ERC) under the European Union’s Starting Grant (No. 949120).","corr_author":"1","type":"conference_abstract","file_date_updated":"2024-01-23T13:00:26Z","month":"04","project":[{"_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa","grant_number":"949120","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","call_identifier":"H2020"}],"title":"Measuring spontaneous charging of single aerosol particles","oa_version":"Published Version","date_created":"2024-01-22T12:09:07Z","doi":"10.5194/egusphere-egu23-6166","article_processing_charge":"No","department":[{"_id":"CaMu"},{"_id":"ScWa"}],"publication":"EGU General Assembly 2023","status":"public","ddc":["530"],"article_number":"6166","citation":{"apa":"Stöllner, A., Lenton, I. C., Muller, C. J., &#38; Waitukaitis, S. R. (2023). Measuring spontaneous charging of single aerosol particles. In <i>EGU General Assembly 2023</i>. Vienna, Austria &#38; Virtual: European Geosciences Union. <a href=\"https://doi.org/10.5194/egusphere-egu23-6166\">https://doi.org/10.5194/egusphere-egu23-6166</a>","ieee":"A. Stöllner, I. C. Lenton, C. J. Muller, and S. R. Waitukaitis, “Measuring spontaneous charging of single aerosol particles,” in <i>EGU General Assembly 2023</i>, Vienna, Austria &#38; Virtual, 2023.","mla":"Stöllner, Andrea, et al. “Measuring Spontaneous Charging of Single Aerosol Particles.” <i>EGU General Assembly 2023</i>, 6166, European Geosciences Union, 2023, doi:<a href=\"https://doi.org/10.5194/egusphere-egu23-6166\">10.5194/egusphere-egu23-6166</a>.","ama":"Stöllner A, Lenton IC, Muller CJ, Waitukaitis SR. Measuring spontaneous charging of single aerosol particles. In: <i>EGU General Assembly 2023</i>. European Geosciences Union; 2023. doi:<a href=\"https://doi.org/10.5194/egusphere-egu23-6166\">10.5194/egusphere-egu23-6166</a>","ista":"Stöllner A, Lenton IC, Muller CJ, Waitukaitis SR. 2023. Measuring spontaneous charging of single aerosol particles. EGU General Assembly 2023. EGU General Assembly, 6166.","chicago":"Stöllner, Andrea, Isaac C Lenton, Caroline J Muller, and Scott R Waitukaitis. “Measuring Spontaneous Charging of Single Aerosol Particles.” In <i>EGU General Assembly 2023</i>. European Geosciences Union, 2023. <a href=\"https://doi.org/10.5194/egusphere-egu23-6166\">https://doi.org/10.5194/egusphere-egu23-6166</a>.","short":"A. Stöllner, I.C. Lenton, C.J. Muller, S.R. Waitukaitis, in:, EGU General Assembly 2023, European Geosciences Union, 2023."},"publisher":"European Geosciences Union","file":[{"date_created":"2024-01-23T13:00:26Z","success":1,"access_level":"open_access","date_updated":"2024-01-23T13:00:26Z","file_size":419736,"checksum":"8d6ddbb359e584b156f991f00196d86b","content_type":"application/pdf","file_id":"14880","relation":"main_file","file_name":"2023_EGU_Stoellner.pdf","creator":"dernst"}],"conference":{"start_date":"2023-04-23","end_date":"2023-04-28","name":"EGU General Assembly","location":"Vienna, Austria & Virtual"},"ec_funded":1,"has_accepted_license":"1","date_updated":"2025-04-14T07:54:10Z","author":[{"full_name":"Stöllner, Andrea","last_name":"Stöllner","first_name":"Andrea","orcid":"0000-0002-0464-8440","id":"4bdcf7f6-eb97-11eb-a6c2-9981bbdc3bed"},{"first_name":"Isaac C","last_name":"Lenton","full_name":"Lenton, Isaac C","orcid":"0000-0002-5010-6984","id":"a550210f-223c-11ec-8182-e2d45e817efb"},{"first_name":"Caroline J","last_name":"Muller","full_name":"Muller, Caroline J","orcid":"0000-0001-5836-5350","id":"f978ccb0-3f7f-11eb-b193-b0e2bd13182b"},{"full_name":"Waitukaitis, Scott R","first_name":"Scott R","last_name":"Waitukaitis","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-2299-3176"}],"year":"2023","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","image":"/images/cc_by.png","short":"CC BY (4.0)","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"oa":1,"day":"23","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87"}]