3 Publications

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[3]
2026 | Epub ahead of print | Journal Article | IST-REx-ID: 22268 | OA | PlanS
S. A. Maddipatla et al., “Experiment-guided AlphaFold3 resolves measurement-consistent protein ensembles,” Nature Biotechnology. Springer Nature, 2026.
[Published Version] View | Files available | DOI | Download Published Version (ext.) | PubMed | Europe PMC
 
[2]
2026 | Published | Conference Paper | IST-REx-ID: 22722 | OA
M. I. Bojan et al., “Representing local protein environments with machine learning force fields,” in 14th International Conference on Learning Representations, Rio de Janeiro, Brazil, 2026, vol. 2026, pp. 100760–100799.
[Published Version] View | Files available | arXiv
 
[1]
2025 | Published | Conference Paper | IST-REx-ID: 21327 | OA
S. A. Maddipatla et al., “Inverse problems with experiment-guided AlphaFold,” in Proceedings of the 42nd International Conference on Machine Learning, Vancouver, Canada, 2025, vol. 267, pp. 42366–42393.
[Published Version] View | Files available | arXiv
 

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3 Publications

Mark all

[3]
2026 | Epub ahead of print | Journal Article | IST-REx-ID: 22268 | OA | PlanS
S. A. Maddipatla et al., “Experiment-guided AlphaFold3 resolves measurement-consistent protein ensembles,” Nature Biotechnology. Springer Nature, 2026.
[Published Version] View | Files available | DOI | Download Published Version (ext.) | PubMed | Europe PMC
 
[2]
2026 | Published | Conference Paper | IST-REx-ID: 22722 | OA
M. I. Bojan et al., “Representing local protein environments with machine learning force fields,” in 14th International Conference on Learning Representations, Rio de Janeiro, Brazil, 2026, vol. 2026, pp. 100760–100799.
[Published Version] View | Files available | arXiv
 
[1]
2025 | Published | Conference Paper | IST-REx-ID: 21327 | OA
S. A. Maddipatla et al., “Inverse problems with experiment-guided AlphaFold,” in Proceedings of the 42nd International Conference on Machine Learning, Vancouver, Canada, 2025, vol. 267, pp. 42366–42393.
[Published Version] View | Files available | arXiv
 

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Citation Style: IEEE

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