Sebastian Wald

Graduate School
Hosten Group

3 Publications

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[3]
2023 | Published | Journal Article | IST-REx-ID: 14749
U. Mishra, V. Li, S. Wald, S. Agafonova, F. R. Diorico, and O. Hosten, “Monitoring and active stabilization of laser injection locking using beam ellipticity,” Optics Letters, vol. 48, no. 15. Optica Publishing Group, pp. 3973–3976, 2023.
[Preprint] View | DOI | arXiv
 
[2]
2023 | Published | Journal Article | IST-REx-ID: 14759 | OA
S. Wald, F. R. Diorico, and O. Hosten, “Analog stabilization of an electro-optic I/Q modulator with an auxiliary modulation tone,” Applied Optics, vol. 62, no. 1. Optica Publishing Group, pp. 1–7, 2023.
[Preprint] View | DOI | Download Preprint (ext.) | arXiv
 
[1]
2020 | Published | Journal Article | IST-REx-ID: 8101 | OA
G. M. Grosjean, S. Wald, J. C. A. Sobarzo Ponce, and S. R. Waitukaitis, “Quantitatively consistent scale-spanning model for same-material tribocharging,” Physical Review Materials, vol. 4, no. 8. American Physical Society, 2020.
[Published Version] View | Files available | DOI | WoS | arXiv
 
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3 Publications

Mark all

[3]
2023 | Published | Journal Article | IST-REx-ID: 14749
U. Mishra, V. Li, S. Wald, S. Agafonova, F. R. Diorico, and O. Hosten, “Monitoring and active stabilization of laser injection locking using beam ellipticity,” Optics Letters, vol. 48, no. 15. Optica Publishing Group, pp. 3973–3976, 2023.
[Preprint] View | DOI | arXiv
 
[2]
2023 | Published | Journal Article | IST-REx-ID: 14759 | OA
S. Wald, F. R. Diorico, and O. Hosten, “Analog stabilization of an electro-optic I/Q modulator with an auxiliary modulation tone,” Applied Optics, vol. 62, no. 1. Optica Publishing Group, pp. 1–7, 2023.
[Preprint] View | DOI | Download Preprint (ext.) | arXiv
 
[1]
2020 | Published | Journal Article | IST-REx-ID: 8101 | OA
G. M. Grosjean, S. Wald, J. C. A. Sobarzo Ponce, and S. R. Waitukaitis, “Quantitatively consistent scale-spanning model for same-material tribocharging,” Physical Review Materials, vol. 4, no. 8. American Physical Society, 2020.
[Published Version] View | Files available | DOI | WoS | arXiv
 
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Citation Style: IEEE

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