3 Publications

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[3]
2026 | Published | Journal Article | IST-REx-ID: 21747 | OA | PlanS
D. Kun, K. T. Strömberg, B. Dakić, P. Walther, and L. A. Rozema, “Testing single-photon entanglement using self-referential measurements,” Optica, vol. 13, no. 4. Optica Publishing Group, pp. 745–751, 2026.
[Published Version] View | Files available | DOI | arXiv
 
[2]
2025 | Published | Journal Article | IST-REx-ID: 19733 | OA
D. Kun, K. T. Strömberg, M. Spagnolo, B. Dakić, L. A. Rozema, and P. Walther, “Direct and efficient detection of quantum superposition,” Physical Review A, vol. 111, no. 5. American Physical Society, 2025.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[1]
2025 | Published | Journal Article | IST-REx-ID: 20797 | OA | PlanS
H. Seabrook, E. Lavie, K. T. Strömberg, M. P. Stafford, and G. Rubino, “Surpassing the loss-noise robustness trade-off in quantum key distribution,” Physical Review Applied, vol. 24, no. 2. American Physical Society, 2025.
[Published Version] View | Files available | DOI | arXiv
 

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3 Publications

Mark all

[3]
2026 | Published | Journal Article | IST-REx-ID: 21747 | OA | PlanS
D. Kun, K. T. Strömberg, B. Dakić, P. Walther, and L. A. Rozema, “Testing single-photon entanglement using self-referential measurements,” Optica, vol. 13, no. 4. Optica Publishing Group, pp. 745–751, 2026.
[Published Version] View | Files available | DOI | arXiv
 
[2]
2025 | Published | Journal Article | IST-REx-ID: 19733 | OA
D. Kun, K. T. Strömberg, M. Spagnolo, B. Dakić, L. A. Rozema, and P. Walther, “Direct and efficient detection of quantum superposition,” Physical Review A, vol. 111, no. 5. American Physical Society, 2025.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[1]
2025 | Published | Journal Article | IST-REx-ID: 20797 | OA | PlanS
H. Seabrook, E. Lavie, K. T. Strömberg, M. P. Stafford, and G. Rubino, “Surpassing the loss-noise robustness trade-off in quantum key distribution,” Physical Review Applied, vol. 24, no. 2. American Physical Society, 2025.
[Published Version] View | Files available | DOI | arXiv
 

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Citation Style: IEEE

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