---
_id: '12109'
abstract:
- lang: eng
text: Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact
electrification (CE) at the nanoscale, but converting KPFM voltage maps to charge
density maps is nontrivial due to long-range forces and complex system geometry.
Here we present a strategy using finite-element method (FEM) simulations to determine
the Green's function of the KPFM probe/insulator/ground system, which allows us
to quantitatively extract surface charge. Testing our approach with synthetic
data, we find that accounting for the atomic force microscope (AFM) tip, cone,
and cantilever is necessary to recover a known input and that existing methods
lead to gross miscalculation or even the incorrect sign of the underlying charge.
Applying it to experimental data, we demonstrate its capacity to extract realistic
surface charge densities and fine details from contact-charged surfaces. Our method
gives a straightforward recipe to convert qualitative KPFM voltage data into quantitative
charge data over a range of experimental conditions, enabling quantitative CE
at the nanoscale.
acknowledged_ssus:
- _id: M-Shop
- _id: NanoFab
- _id: ScienComp
acknowledgement: "This project has received funding from the European Research Council
(ERC) under the European Union’s Horizon 2020 research and innovation programme
(Grant Agreement\r\nNo. 949120). This research was supported by the Scientific Service
Units of the Institute of Science and Technology Austria (ISTA) through resources
provided by the Miba Machine\r\nShop, the Nanofabrication Facility, and the Scientific
Computing Facility. We thank F. Stumpf from Park Systems for useful discussions
and support with scanning probe microscopy.\r\nF.P. and J.C.S. contributed equally
to this work."
article_number: '125605'
article_processing_charge: No
article_type: original
author:
- first_name: Felix
full_name: Pertl, Felix
id: 6313aec0-15b2-11ec-abd3-ed67d16139af
last_name: Pertl
- first_name: Juan Carlos A
full_name: Sobarzo Ponce, Juan Carlos A
id: 4B807D68-AE37-11E9-AC72-31CAE5697425
last_name: Sobarzo Ponce
- first_name: Lubuna B
full_name: Shafeek, Lubuna B
id: 3CD37A82-F248-11E8-B48F-1D18A9856A87
last_name: Shafeek
orcid: 0000-0001-7180-6050
- first_name: Tobias
full_name: Cramer, Tobias
last_name: Cramer
- first_name: Scott R
full_name: Waitukaitis, Scott R
id: 3A1FFC16-F248-11E8-B48F-1D18A9856A87
last_name: Waitukaitis
orcid: 0000-0002-2299-3176
citation:
ama: Pertl F, Sobarzo Ponce JCA, Shafeek LB, Cramer T, Waitukaitis SR. Quantifying
nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid
approach. Physical Review Materials. 2022;6(12). doi:10.1103/PhysRevMaterials.6.125605
apa: Pertl, F., Sobarzo Ponce, J. C. A., Shafeek, L. B., Cramer, T., & Waitukaitis,
S. R. (2022). Quantifying nanoscale charge density features of contact-charged
surfaces with an FEM/KPFM-hybrid approach. Physical Review Materials. American
Physical Society. https://doi.org/10.1103/PhysRevMaterials.6.125605
chicago: Pertl, Felix, Juan Carlos A Sobarzo Ponce, Lubuna B Shafeek, Tobias Cramer,
and Scott R Waitukaitis. “Quantifying Nanoscale Charge Density Features of Contact-Charged
Surfaces with an FEM/KPFM-Hybrid Approach.” Physical Review Materials.
American Physical Society, 2022. https://doi.org/10.1103/PhysRevMaterials.6.125605.
ieee: F. Pertl, J. C. A. Sobarzo Ponce, L. B. Shafeek, T. Cramer, and S. R. Waitukaitis,
“Quantifying nanoscale charge density features of contact-charged surfaces with
an FEM/KPFM-hybrid approach,” Physical Review Materials, vol. 6, no. 12.
American Physical Society, 2022.
ista: Pertl F, Sobarzo Ponce JCA, Shafeek LB, Cramer T, Waitukaitis SR. 2022. Quantifying
nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid
approach. Physical Review Materials. 6(12), 125605.
mla: Pertl, Felix, et al. “Quantifying Nanoscale Charge Density Features of Contact-Charged
Surfaces with an FEM/KPFM-Hybrid Approach.” Physical Review Materials,
vol. 6, no. 12, 125605, American Physical Society, 2022, doi:10.1103/PhysRevMaterials.6.125605.
short: F. Pertl, J.C.A. Sobarzo Ponce, L.B. Shafeek, T. Cramer, S.R. Waitukaitis,
Physical Review Materials 6 (2022).
date_created: 2023-01-08T23:00:53Z
date_published: 2022-12-29T00:00:00Z
date_updated: 2023-08-03T14:11:29Z
day: '29'
department:
- _id: ScWa
- _id: NanoFab
doi: 10.1103/PhysRevMaterials.6.125605
ec_funded: 1
external_id:
arxiv:
- '2209.01889'
isi:
- '000908384800001'
intvolume: ' 6'
isi: 1
issue: '12'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: ' https://doi.org/10.48550/arXiv.2209.01889'
month: '12'
oa: 1
oa_version: Preprint
project:
- _id: 0aa60e99-070f-11eb-9043-a6de6bdc3afa
call_identifier: H2020
grant_number: '949120'
name: 'Tribocharge: a multi-scale approach to an enduring problem in physics'
publication: Physical Review Materials
publication_identifier:
eissn:
- 2475-9953
publication_status: published
publisher: American Physical Society
quality_controlled: '1'
scopus_import: '1'
status: public
title: Quantifying nanoscale charge density features of contact-charged surfaces with
an FEM/KPFM-hybrid approach
type: journal_article
user_id: 4359f0d1-fa6c-11eb-b949-802e58b17ae8
volume: 6
year: '2022'
...