{"publisher":"IEEE","date_updated":"2024-11-12T07:51:57Z","oa_version":"None","page":"345-347","month":"12","scopus_import":"1","author":[{"last_name":"Bronstein","first_name":"M.M.","full_name":"Bronstein, M.M."},{"full_name":"Bronstein, Alexander","orcid":"0000-0001-9699-8730","id":"58f3726e-7cba-11ef-ad8b-e6e8cb3904e6","last_name":"Bronstein","first_name":"Alexander"},{"last_name":"Zibulevsky","first_name":"M.","full_name":"Zibulevsky, M."},{"full_name":"Azhari, H.","first_name":"H.","last_name":"Azhari"}],"citation":{"short":"M.M. Bronstein, A.M. Bronstein, M. Zibulevsky, H. Azhari, in:, The 22nd Convention on Electrical and Electronics Engineers in Israel, IEEE, 2002, pp. 345–347.","apa":"Bronstein, M. M., Bronstein, A. M., Zibulevsky, M., &#38; Azhari, H. (2002). Application of the NUFFT for reconstruction problems in diffraction tomography. In <i>The 22nd Convention on Electrical and Electronics Engineers in Israel</i> (Vol. 2002–January, pp. 345–347). Tel-Aviv, Israel: IEEE. <a href=\"https://doi.org/10.1109/eeei.2002.1178495\">https://doi.org/10.1109/eeei.2002.1178495</a>","ama":"Bronstein MM, Bronstein AM, Zibulevsky M, Azhari H. Application of the NUFFT for reconstruction problems in diffraction tomography. In: <i>The 22nd Convention on Electrical and Electronics Engineers in Israel</i>. Vol 2002-January. IEEE; 2002:345-347. doi:<a href=\"https://doi.org/10.1109/eeei.2002.1178495\">10.1109/eeei.2002.1178495</a>","chicago":"Bronstein, M.M., Alex M. Bronstein, M. Zibulevsky, and H. Azhari. “Application of the NUFFT for Reconstruction Problems in Diffraction Tomography.” In <i>The 22nd Convention on Electrical and Electronics Engineers in Israel</i>, 2002–January:345–47. IEEE, 2002. <a href=\"https://doi.org/10.1109/eeei.2002.1178495\">https://doi.org/10.1109/eeei.2002.1178495</a>.","ista":"Bronstein MM, Bronstein AM, Zibulevsky M, Azhari H. 2002. Application of the NUFFT for reconstruction problems in diffraction tomography. The 22nd Convention on Electrical and Electronics Engineers in Israel. Convention on Electrical and Electronics Engineers vol. 2002–January, 345–347.","mla":"Bronstein, M. M., et al. “Application of the NUFFT for Reconstruction Problems in Diffraction Tomography.” <i>The 22nd Convention on Electrical and Electronics Engineers in Israel</i>, vol. 2002–January, IEEE, 2002, pp. 345–47, doi:<a href=\"https://doi.org/10.1109/eeei.2002.1178495\">10.1109/eeei.2002.1178495</a>.","ieee":"M. M. Bronstein, A. M. Bronstein, M. Zibulevsky, and H. Azhari, “Application of the NUFFT for reconstruction problems in diffraction tomography,” in <i>The 22nd Convention on Electrical and Electronics Engineers in Israel</i>, Tel-Aviv, Israel, 2002, vol. 2002–January, pp. 345–347."},"status":"public","quality_controlled":"1","day":"01","title":"Application of the NUFFT for reconstruction problems in diffraction tomography","publication_status":"published","date_published":"2002-12-01T00:00:00Z","extern":"1","conference":{"end_date":"2002-12-01","start_date":"2002-12-01","name":"Convention on Electrical and Electronics Engineers","location":"Tel-Aviv, Israel"},"year":"2002","_id":"18383","article_processing_charge":"No","doi":"10.1109/eeei.2002.1178495","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","date_created":"2024-10-15T11:20:54Z","publication_identifier":{"isbn":["0780376935"]},"type":"conference","volume":"2002-January","language":[{"iso":"eng"}],"publication":"The 22nd Convention on Electrical and Electronics Engineers in Israel"}