{"conference":{"name":"8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro","location":" Chicago, IL, United States","start_date":"2011-03-30","end_date":"2011-04-02"},"language":[{"iso":"eng"}],"publication_status":"published","publication":"2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro","user_id":"3E5EF7F0-F248-11E8-B48F-1D18A9856A87","publisher":"IEEE","date_published":"2011-06-09T00:00:00Z","oa_version":"None","title":"Boosted metric learning for 3D multi-modal deformable registration","quality_controlled":"1","article_processing_charge":"No","abstract":[{"lang":"eng","text":"Defining a suitable metric is one of the biggest challenges in deformable image fusion from different modalities. In this paper, we propose a novel approach for multi-modal metric learning in the deformable registration framework that consists of embedding data from both modalities into a common metric space whose metric is used to parametrize the similarity. Specifically, we use image representation in the Fourier/Gabor space which introduces invariance to the local pose parameters, and the Hamming metric as the target embedding space, which allows constructing the embedding using boosted learning algorithms. The resulting metric is incorporated into a discrete optimization framework. Very promising results demonstrate the potential of the proposed method."}],"citation":{"short":"F. Michel, M. Bronstein, A.M. Bronstein, N. Paragios, in:, 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, IEEE, 2011.","ista":"Michel F, Bronstein M, Bronstein AM, Paragios N. 2011. Boosted metric learning for 3D multi-modal deformable registration. 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619.","ieee":"F. Michel, M. Bronstein, A. M. Bronstein, and N. Paragios, “Boosted metric learning for 3D multi-modal deformable registration,” in 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Chicago, IL, United States, 2011.","ama":"Michel F, Bronstein M, Bronstein AM, Paragios N. Boosted metric learning for 3D multi-modal deformable registration. In: 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. IEEE; 2011. doi:10.1109/isbi.2011.5872619","mla":"Michel, Fabrice, et al. “Boosted Metric Learning for 3D Multi-Modal Deformable Registration.” 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619, IEEE, 2011, doi:10.1109/isbi.2011.5872619.","chicago":"Michel, Fabrice, Michael Bronstein, Alex M. Bronstein, and Nikos Paragios. “Boosted Metric Learning for 3D Multi-Modal Deformable Registration.” In 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. IEEE, 2011. https://doi.org/10.1109/isbi.2011.5872619.","apa":"Michel, F., Bronstein, M., Bronstein, A. M., & Paragios, N. (2011). Boosted metric learning for 3D multi-modal deformable registration. In 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. Chicago, IL, United States: IEEE. https://doi.org/10.1109/isbi.2011.5872619"},"day":"09","_id":"18406","status":"public","month":"06","date_updated":"2024-12-04T11:55:42Z","scopus_import":"1","article_number":"5872619","date_created":"2024-10-15T11:20:54Z","type":"conference","extern":"1","doi":"10.1109/isbi.2011.5872619","author":[{"first_name":"Fabrice","full_name":"Michel, Fabrice","last_name":"Michel"},{"first_name":"Michael","full_name":"Bronstein, Michael","last_name":"Bronstein"},{"orcid":"0000-0001-9699-8730","first_name":"Alexander","full_name":"Bronstein, Alexander","last_name":"Bronstein","id":"58f3726e-7cba-11ef-ad8b-e6e8cb3904e6"},{"full_name":"Paragios, Nikos","first_name":"Nikos","last_name":"Paragios"}],"publication_identifier":{"isbn":["9781424441280"],"eissn":["1945-8452"]},"year":"2011"}