{"month":"09","issue":"14","ddc":["530"],"intvolume":"       135","PlanS_conform":"1","language":[{"iso":"eng"}],"citation":{"ieee":"F. Pertl, I. C. Lenton, T. Cramer, and S. R. Waitukaitis, “No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces,” <i>Physical Review Letters</i>, vol. 135, no. 14. American Physical Society, 2025.","apa":"Pertl, F., Lenton, I. C., Cramer, T., &#38; Waitukaitis, S. R. (2025). No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. <i>Physical Review Letters</i>. American Physical Society. <a href=\"https://doi.org/10.1103/lcsm-xxty\">https://doi.org/10.1103/lcsm-xxty</a>","ista":"Pertl F, Lenton IC, Cramer T, Waitukaitis SR. 2025. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. Physical Review Letters. 135(14), 146202.","chicago":"Pertl, Felix, Isaac C Lenton, Tobias Cramer, and Scott R Waitukaitis. “No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces.” <i>Physical Review Letters</i>. American Physical Society, 2025. <a href=\"https://doi.org/10.1103/lcsm-xxty\">https://doi.org/10.1103/lcsm-xxty</a>.","mla":"Pertl, Felix, et al. “No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces.” <i>Physical Review Letters</i>, vol. 135, no. 14, 146202, American Physical Society, 2025, doi:<a href=\"https://doi.org/10.1103/lcsm-xxty\">10.1103/lcsm-xxty</a>.","ama":"Pertl F, Lenton IC, Cramer T, Waitukaitis SR. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. <i>Physical Review Letters</i>. 2025;135(14). doi:<a href=\"https://doi.org/10.1103/lcsm-xxty\">10.1103/lcsm-xxty</a>","short":"F. Pertl, I.C. Lenton, T. Cramer, S.R. Waitukaitis, Physical Review Letters 135 (2025)."},"publication_identifier":{"issn":["0031-9007"],"eissn":["1079-7114"]},"year":"2025","_id":"20481","file":[{"checksum":"7e45e89b8db0b7f01e63185c68e4b0f9","relation":"main_file","date_updated":"2025-10-23T09:32:31Z","file_id":"20522","success":1,"file_size":1692251,"creator":"dernst","content_type":"application/pdf","file_name":"2025_PhysReviewLetters_Pertl.pdf","date_created":"2025-10-23T09:32:31Z","access_level":"open_access"}],"oa_version":"Published Version","external_id":{"arxiv":["2502.12718"]},"publication":"Physical Review Letters","abstract":[{"lang":"eng","text":"Kelvin probe force microscopy (KPFM) is widely used in stationary and dynamic studies of contact electrification. An obvious question that connects these two has been overlooked: when are charge dynamics too fast for stationary studies to be meaningful? Using a rapid transfer system to quickly perform KPFM after contact, we find the dynamics are too fast in all but the best insulators. Our data further suggest that dynamics are caused by bulk as opposed to surface conductivity, and that charge-transfer heterogeneity is less prevalent than previously suggested."}],"department":[{"_id":"ScWa"}],"article_processing_charge":"Yes (via OA deal)","ec_funded":1,"publication_status":"published","acknowledged_ssus":[{"_id":"M-Shop"},{"_id":"NanoFab"},{"_id":"LifeSc"}],"user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","publisher":"American Physical Society","doi":"10.1103/lcsm-xxty","quality_controlled":"1","article_type":"original","date_created":"2025-10-16T13:13:29Z","date_published":"2025-09-30T00:00:00Z","acknowledgement":"This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (Grant agreement No. 949120). This research was supported by the Scientific Service Units of The Institute of Science and Technology Austria (ISTA) through resources provided by the Miba Machine Shop, the Nanofabrication Facility and Lab Support Facility.","scopus_import":"1","author":[{"id":"6313aec0-15b2-11ec-abd3-ed67d16139af","full_name":"Pertl, Felix","first_name":"Felix","last_name":"Pertl","orcid":"0000-0003-0463-5794"},{"id":"a550210f-223c-11ec-8182-e2d45e817efb","full_name":"Lenton, Isaac C","first_name":"Isaac C","last_name":"Lenton","orcid":"0000-0002-5010-6984"},{"first_name":"Tobias","last_name":"Cramer","full_name":"Cramer, Tobias"},{"first_name":"Scott R","last_name":"Waitukaitis","orcid":"0000-0002-2299-3176","id":"3A1FFC16-F248-11E8-B48F-1D18A9856A87","full_name":"Waitukaitis, Scott R"}],"project":[{"_id":"0aa60e99-070f-11eb-9043-a6de6bdc3afa","call_identifier":"H2020","name":"Tribocharge: a multi-scale approach to an enduring problem in physics","grant_number":"949120"}],"article_number":"146202","date_updated":"2025-10-23T09:39:04Z","OA_place":"publisher","volume":135,"day":"30","status":"public","tmp":{"legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","short":"CC BY (4.0)","image":"/images/cc_by.png","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)"},"oa":1,"file_date_updated":"2025-10-23T09:32:31Z","corr_author":"1","type":"journal_article","arxiv":1,"OA_type":"hybrid","has_accepted_license":"1","title":"No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces","related_material":{"record":[{"relation":"research_data","status":"public","id":"20523"}]}}