---
res:
  bibo_abstract:
  - (Scanning) transmission electron microscopy ((S)TEM) has significantly advanced
    materials science but faces challenges in correlating precise atomic structure
    information with the functional properties of devices due to its time-intensive
    nature. To address this, an analytical workflow is introduced for the holistic
    characterization, modelling, and simulation of device heterostructures. This workflow
    automates the experimental (S)TEM data analysis, providing an in-depth characterization
    of crystallographic information, 3D orientation, elemental composition, and strain
    distribution. It reduces a process that typically takes days for a trained human
    into an automatic routine solved in minutes. Utilizing a physics-guided artificial
    intelligence model, it generates representative descriptions of materials and
    samples. The workflow culminates in creating digital twins of systems limited
    with at least one axis of translational invariance –3D finite element and atomic
    models of millions of atoms–enabling simulations that provide crucial insights
    into device behavior in practical applications. Demonstrated with SiGe planar
    heterostructures for scalable spin qubits, the workflow links digital twins to
    theoretical properties, revealing how atomic structure impacts materials and functional
    properties such as spatially-resolved phononic or electronic characteristics,
    or (inverse) spin orbit lengths. The versatility of the workflow is demonstrated
    through its application to a wide array of materials systems, device configurations,
    and sample morphologies.@eng
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Marc
      foaf_name: Botifoll, Marc
      foaf_surname: Botifoll
  - foaf_Person:
      foaf_givenName: Ivan
      foaf_name: Pinto-Huguet, Ivan
      foaf_surname: Pinto-Huguet
  - foaf_Person:
      foaf_givenName: Enzo
      foaf_name: Rotunno, Enzo
      foaf_surname: Rotunno
  - foaf_Person:
      foaf_givenName: Thomas
      foaf_name: Galvani, Thomas
      foaf_surname: Galvani
  - foaf_Person:
      foaf_givenName: Catalina
      foaf_name: Coll, Catalina
      foaf_surname: Coll
  - foaf_Person:
      foaf_givenName: Payam Habibzadeh
      foaf_name: Kavkani, Payam Habibzadeh
      foaf_surname: Kavkani
  - foaf_Person:
      foaf_givenName: Maria Chiara
      foaf_name: Spadaro, Maria Chiara
      foaf_surname: Spadaro
  - foaf_Person:
      foaf_givenName: Yann Michel
      foaf_name: Niquet, Yann Michel
      foaf_surname: Niquet
  - foaf_Person:
      foaf_givenName: Martin Børstad
      foaf_name: Eriksen, Martin Børstad
      foaf_surname: Eriksen
  - foaf_Person:
      foaf_givenName: Sara
      foaf_name: Martí-Sánchez, Sara
      foaf_surname: Martí-Sánchez
  - foaf_Person:
      foaf_givenName: Georgios
      foaf_name: Katsaros, Georgios
      foaf_surname: Katsaros
      foaf_workInfoHomepage: http://www.librecat.org/personId=38DB5788-F248-11E8-B48F-1D18A9856A87
    orcid: 0000-0001-8342-202X
  - foaf_Person:
      foaf_givenName: Giordano
      foaf_name: Scappucci, Giordano
      foaf_surname: Scappucci
  - foaf_Person:
      foaf_givenName: Peter
      foaf_name: Krogstrup, Peter
      foaf_surname: Krogstrup
  - foaf_Person:
      foaf_givenName: Giovanni
      foaf_name: Isella, Giovanni
      foaf_surname: Isella
  - foaf_Person:
      foaf_givenName: Andreu
      foaf_name: Cabot, Andreu
      foaf_surname: Cabot
  - foaf_Person:
      foaf_givenName: Gonzalo
      foaf_name: Merino, Gonzalo
      foaf_surname: Merino
  - foaf_Person:
      foaf_givenName: Pablo
      foaf_name: Ordejón, Pablo
      foaf_surname: Ordejón
  - foaf_Person:
      foaf_givenName: Stephan
      foaf_name: Roche, Stephan
      foaf_surname: Roche
  - foaf_Person:
      foaf_givenName: Vincenzo
      foaf_name: Grillo, Vincenzo
      foaf_surname: Grillo
  - foaf_Person:
      foaf_givenName: Jordi
      foaf_name: Arbiol, Jordi
      foaf_surname: Arbiol
  bibo_doi: 10.1002/adma.202506785
  dct_date: 2025^xs_gYear
  dct_identifier:
  - UT:001597428400001
  dct_isPartOf:
  - http://id.crossref.org/issn/0935-9648
  - http://id.crossref.org/issn/1521-4095
  dct_language: eng
  dct_publisher: Wiley@
  dct_title: 'Artificial intelligence-assisted workflow for transmission electron
    microscopy: From data analysis automation to materials knowledge unveiling@'
...