@article{21532,
  abstract     = {Recent research in nanophotonics for scintillation-based imaging has demonstrated promising improvements in scintillator performance. In parallel, advances in nanophotonics have enabled wavefront control through metasurfaces, a capability that has transformed fields such as microscopy by allowing tailored control of optical propagation. This naturally raises the following question, which we address in this Perspective: can wavefront-control strategies be leveraged to improve scintillation-based imaging? To answer this question, we explore nanophotonic- and metasurface-enabled wavefront control in scintillators to mitigate image blurring arising from their intrinsically diffuse light emission. While depth-of-field extension in scintillation faces fundamental limitations absent in microscopy, this approach reveals promising avenues, including stacked scintillators, selective spatial-frequency enhancement, and X-ray energy-dependent imaging. These results clarify the key distinctions in adapting wavefront engineering to scintillation and its potential to enable tailored detection strategies.},
  author       = {Chen, Joshua and Vaidya, Sachin and Pajovic, Simo and Choi, Seou and Michaels, William and Martin-Monier, Louis and Hu, Juejun and Cogswell, Carol and Roques-Carmes, Charles and Soljačić, Marin},
  issn         = {2330-4022},
  journal      = {ACS Photonics},
  number       = {7},
  pages        = {1757–1766},
  publisher    = {American Chemical Society},
  title        = {{Wavefront engineering for scintillation-based imaging}},
  doi          = {10.1021/acsphotonics.5c03124},
  volume       = {13},
  year         = {2026},
}