Wavefront engineering for scintillation-based imaging Chen, Joshua Vaidya, Sachin Pajovic, Simo Choi, Seou Michaels, William Martin-Monier, Louis Hu, Juejun Cogswell, Carol Roques-Carmes, Charles Soljačić, Marin Recent research in nanophotonics for scintillation-based imaging has demonstrated promising improvements in scintillator performance. In parallel, advances in nanophotonics have enabled wavefront control through metasurfaces, a capability that has transformed fields such as microscopy by allowing tailored control of optical propagation. This naturally raises the following question, which we address in this Perspective: can wavefront-control strategies be leveraged to improve scintillation-based imaging? To answer this question, we explore nanophotonic- and metasurface-enabled wavefront control in scintillators to mitigate image blurring arising from their intrinsically diffuse light emission. While depth-of-field extension in scintillation faces fundamental limitations absent in microscopy, this approach reveals promising avenues, including stacked scintillators, selective spatial-frequency enhancement, and X-ray energy-dependent imaging. These results clarify the key distinctions in adapting wavefront engineering to scintillation and its potential to enable tailored detection strategies. American Chemical Society 2026 info:eu-repo/semantics/article doc-type:article text http://purl.org/coar/resource_type/c_2df8fbb1 https://research-explorer.ista.ac.at/record/21532 Chen J, Vaidya S, Pajovic S, et al. Wavefront engineering for scintillation-based imaging. <i>ACS Photonics</i>. 2026;13(7):1757–1766. doi:<a href="https://doi.org/10.1021/acsphotonics.5c03124">10.1021/acsphotonics.5c03124</a> eng info:eu-repo/semantics/altIdentifier/doi/10.1021/acsphotonics.5c03124 info:eu-repo/semantics/altIdentifier/e-issn/2330-4022 info:eu-repo/semantics/altIdentifier/arxiv/2601.09830 info:eu-repo/semantics/openAccess