[{"doi":"10.1021/acsphotonics.5c03124","page":"1757–1766","author":[{"last_name":"Chen","full_name":"Chen, Joshua","first_name":"Joshua"},{"last_name":"Vaidya","full_name":"Vaidya, Sachin","first_name":"Sachin"},{"first_name":"Simo","full_name":"Pajovic, Simo","last_name":"Pajovic"},{"last_name":"Choi","full_name":"Choi, Seou","first_name":"Seou"},{"last_name":"Michaels","first_name":"William","full_name":"Michaels, William"},{"first_name":"Louis","full_name":"Martin-Monier, Louis","last_name":"Martin-Monier"},{"last_name":"Hu","first_name":"Juejun","full_name":"Hu, Juejun"},{"last_name":"Cogswell","full_name":"Cogswell, Carol","first_name":"Carol"},{"id":"e2e68fc9-6505-11ef-a541-eb4e72cc3e82","last_name":"Roques-Carmes","full_name":"Roques-Carmes, Charles","first_name":"Charles"},{"last_name":"Soljačić","full_name":"Soljačić, Marin","first_name":"Marin"}],"title":"Wavefront engineering for scintillation-based imaging","oa_version":"Preprint","publisher":"American Chemical Society","oa":1,"month":"03","article_type":"original","publication_identifier":{"eissn":["2330-4022"]},"year":"2026","user_id":"2DF688A6-F248-11E8-B48F-1D18A9856A87","OA_type":"green","date_created":"2026-03-30T12:22:47Z","date_updated":"2026-05-05T07:53:27Z","arxiv":1,"status":"public","date_published":"2026-03-01T00:00:00Z","day":"01","citation":{"ieee":"J. Chen <i>et al.</i>, “Wavefront engineering for scintillation-based imaging,” <i>ACS Photonics</i>, vol. 13, no. 7. American Chemical Society, pp. 1757–1766, 2026.","ama":"Chen J, Vaidya S, Pajovic S, et al. Wavefront engineering for scintillation-based imaging. <i>ACS Photonics</i>. 2026;13(7):1757–1766. doi:<a href=\"https://doi.org/10.1021/acsphotonics.5c03124\">10.1021/acsphotonics.5c03124</a>","mla":"Chen, Joshua, et al. “Wavefront Engineering for Scintillation-Based Imaging.” <i>ACS Photonics</i>, vol. 13, no. 7, American Chemical Society, 2026, pp. 1757–1766, doi:<a href=\"https://doi.org/10.1021/acsphotonics.5c03124\">10.1021/acsphotonics.5c03124</a>.","short":"J. Chen, S. Vaidya, S. Pajovic, S. Choi, W. Michaels, L. Martin-Monier, J. Hu, C. Cogswell, C. Roques-Carmes, M. Soljačić, ACS Photonics 13 (2026) 1757–1766.","chicago":"Chen, Joshua, Sachin Vaidya, Simo Pajovic, Seou Choi, William Michaels, Louis Martin-Monier, Juejun Hu, Carol Cogswell, Charles Roques-Carmes, and Marin Soljačić. “Wavefront Engineering for Scintillation-Based Imaging.” <i>ACS Photonics</i>. American Chemical Society, 2026. <a href=\"https://doi.org/10.1021/acsphotonics.5c03124\">https://doi.org/10.1021/acsphotonics.5c03124</a>.","apa":"Chen, J., Vaidya, S., Pajovic, S., Choi, S., Michaels, W., Martin-Monier, L., … Soljačić, M. (2026). Wavefront engineering for scintillation-based imaging. <i>ACS Photonics</i>. American Chemical Society. <a href=\"https://doi.org/10.1021/acsphotonics.5c03124\">https://doi.org/10.1021/acsphotonics.5c03124</a>","ista":"Chen J, Vaidya S, Pajovic S, Choi S, Michaels W, Martin-Monier L, Hu J, Cogswell C, Roques-Carmes C, Soljačić M. 2026. Wavefront engineering for scintillation-based imaging. ACS Photonics. 13(7), 1757–1766."},"intvolume":"        13","type":"journal_article","main_file_link":[{"url":"https://doi.org/10.48550/arXiv.2601.09830","open_access":"1"}],"issue":"7","article_processing_charge":"No","publication_status":"published","publication":"ACS Photonics","OA_place":"repository","_id":"21532","volume":13,"abstract":[{"lang":"eng","text":"Recent research in nanophotonics for scintillation-based imaging has demonstrated promising improvements in scintillator performance. In parallel, advances in nanophotonics have enabled wavefront control through metasurfaces, a capability that has transformed fields such as microscopy by allowing tailored control of optical propagation. This naturally raises the following question, which we address in this Perspective: can wavefront-control strategies be leveraged to improve scintillation-based imaging? To answer this question, we explore nanophotonic- and metasurface-enabled wavefront control in scintillators to mitigate image blurring arising from their intrinsically diffuse light emission. While depth-of-field extension in scintillation faces fundamental limitations absent in microscopy, this approach reveals promising avenues, including stacked scintillators, selective spatial-frequency enhancement, and X-ray energy-dependent imaging. These results clarify the key distinctions in adapting wavefront engineering to scintillation and its potential to enable tailored detection strategies."}],"scopus_import":"1","external_id":{"arxiv":["2601.09830"]},"extern":"1","quality_controlled":"1","language":[{"iso":"eng"}]}]