{"extern":"1","intvolume":" 17","acknowledgement":"The research of this author was supported by the Amoco Foundation Facility for the Development of Computer Science 1-6-44862.","quality_controlled":"1","_id":"4091","publication_identifier":{"eissn":["1095-7111"],"issn":["0097-5397"]},"author":[{"last_name":"Edelsbrunner","full_name":"Edelsbrunner, Herbert","first_name":"Herbert","id":"3FB178DA-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-9823-6833"},{"full_name":"Skiena, Steven","last_name":"Skiena","first_name":"Steven"}],"date_created":"2018-12-11T12:06:53Z","issue":"5","page":"870 - 882","article_processing_charge":"No","doi":"10.1137/0217054 ","main_file_link":[{"url":"https://epubs.siam.org/doi/10.1137/0217054"}],"publication_status":"published","month":"01","user_id":"ea97e931-d5af-11eb-85d4-e6957dddbf17","title":"Probing convex polygons with X-Rays","date_published":"1988-01-01T00:00:00Z","oa_version":"None","year":"1988","volume":17,"type":"journal_article","language":[{"iso":"eng"}],"citation":{"mla":"Edelsbrunner, Herbert, and Steven Skiena. “Probing Convex Polygons with X-Rays.” SIAM Journal on Computing, vol. 17, no. 5, SIAM, 1988, pp. 870–82, doi:10.1137/0217054 .","short":"H. Edelsbrunner, S. Skiena, SIAM Journal on Computing 17 (1988) 870–882.","ama":"Edelsbrunner H, Skiena S. Probing convex polygons with X-Rays. SIAM Journal on Computing. 1988;17(5):870-882. doi:10.1137/0217054 ","ista":"Edelsbrunner H, Skiena S. 1988. Probing convex polygons with X-Rays. SIAM Journal on Computing. 17(5), 870–882.","ieee":"H. Edelsbrunner and S. Skiena, “Probing convex polygons with X-Rays,” SIAM Journal on Computing, vol. 17, no. 5. SIAM, pp. 870–882, 1988.","chicago":"Edelsbrunner, Herbert, and Steven Skiena. “Probing Convex Polygons with X-Rays.” SIAM Journal on Computing. SIAM, 1988. https://doi.org/10.1137/0217054 .","apa":"Edelsbrunner, H., & Skiena, S. (1988). Probing convex polygons with X-Rays. SIAM Journal on Computing. SIAM. https://doi.org/10.1137/0217054 "},"publist_id":"2030","abstract":[{"lang":"eng","text":"An X-ray probe through a polygon measures the length of intersection between a line and the polygon. This paper considers the properties of various classes of X-ray probes, and shows how they interact to give finite strategies for completely describing convex n-gons. It is shown that (3n/2)+6 probes are sufficient to verify a specified n-gon, while for determining convex polygons (3n-1)/2 X-ray probes are necesssary and 5n+O(1) sufficient, with 3n+O(1) sufficient given that a lower bound on the size of the smallest edge of P is known."}],"scopus_import":"1","status":"public","day":"01","publication":"SIAM Journal on Computing","article_type":"original","date_updated":"2022-02-08T11:14:23Z","publisher":"SIAM"}