3 Publications

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[3]
2025 | Published | Journal Article | IST-REx-ID: 19278 | OA
J. C. A. Sobarzo Ponce et al., “Spontaneous ordering of identical materials into a triboelectric series,” Nature, vol. 638, no. 8051. Springer Nature, 2025.
[Published Version] View | Files available | DOI | PubMed | Europe PMC
 
[2]
2024 | Published | Journal Article | IST-REx-ID: 17373 | OA
I. C. Lenton, F. Pertl, L. B. Shafeek, and S. R. Waitukaitis, “Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging,” Journal of Applied Physics, vol. 136, no. 4. AIP Publishing, 2024.
[Published Version] View | Files available | DOI
 
[1]
2022 | Published | Journal Article | IST-REx-ID: 12109 | OA
F. Pertl, J. C. A. Sobarzo Ponce, L. B. Shafeek, T. Cramer, and S. R. Waitukaitis, “Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach,” Physical Review Materials, vol. 6, no. 12. American Physical Society, 2022.
[Preprint] View | DOI | Download Preprint (ext.) | WoS | arXiv
 

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3 Publications

Mark all

[3]
2025 | Published | Journal Article | IST-REx-ID: 19278 | OA
J. C. A. Sobarzo Ponce et al., “Spontaneous ordering of identical materials into a triboelectric series,” Nature, vol. 638, no. 8051. Springer Nature, 2025.
[Published Version] View | Files available | DOI | PubMed | Europe PMC
 
[2]
2024 | Published | Journal Article | IST-REx-ID: 17373 | OA
I. C. Lenton, F. Pertl, L. B. Shafeek, and S. R. Waitukaitis, “Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging,” Journal of Applied Physics, vol. 136, no. 4. AIP Publishing, 2024.
[Published Version] View | Files available | DOI
 
[1]
2022 | Published | Journal Article | IST-REx-ID: 12109 | OA
F. Pertl, J. C. A. Sobarzo Ponce, L. B. Shafeek, T. Cramer, and S. R. Waitukaitis, “Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach,” Physical Review Materials, vol. 6, no. 12. American Physical Society, 2022.
[Preprint] View | DOI | Download Preprint (ext.) | WoS | arXiv
 

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Citation Style: IEEE

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