XIPE: The x-ray imaging polarimetry explorer

Soffitta, Paolo; Bellazzini, Ronaldo; Bozzo, Enrico; Burwitz, Vadim; Castro Tirado, Alberto; Costa, Enrico; Courvoisier, Thierry; Feng, Hua; Gburek, Szymon; Goosmann, Rene'; Karas, Vladimir; Matt, Giorgio; Muleri, Fabio; Nandra, Kirpal; Pearce, Mark; Poutanen, Juri; Reglero, Victor; Graziati, Maria Dolores; Santangelo, Andrea; Tagliaferri, Gianpiero; Tenzer, Christopher; Vink, Jacco; Weisskopf, Martin; Zane, Silvia; Agudo, I.; Antonelli, A.; Attina, P.; Baldini, L.; Bykov, A.; Carpentiero, R.; Cavazzuti, E.; Churazov, E.; Del Monte, E.; De Martino, D.; Donnarumma, I.; Doroshenko, V.; Evangelista, Y.; Ferreira, I.; Gallo, E.; Grosso, N.; Kaaret, P.; Kuulkers, E.; Laranaga, J.; Latronico, L.; Lumb, D. H.; Macian, J.; Malzac, J.; Marin, F.; Massaro, E.; Minuti, M.; Mundell, C.; Ness, J. U.; Oosterbroek, T.; Paltani, S.; Pareschi, G.; Perna, R.; Petrucci, P.-O.; Pinazo, H. B.; Pinchera, M.; Rodriguez, J. P.; Roncadelli, M.; Santovincenzo, A.; Sazonov, S.; Sgro, C.; Spiga, D.; Svoboda, J.; Theobald, C.; Theodorou, T.; Turolla, R.; Wilhelmi de Ona, E.; Winter, B.; Akbar, A. M.; Allan, H.; Aloisio, R.; Altamirano, D.; Amati, L.; Amato, E.; Angelakis, E.; Arezu, J.; Atteia, J.-L.; Axelsson, M.; Bachetti, M.; Ballo, L.; Balman, S.; Bandiera, R.; Barcons, X.; Basso, S.; Baykal, A.; Becker, W.; Behar, E.; Beheshtipour, B.; Belmont, R.; Berger, E.; Bernardini, F.; Bianchi, S.; Bisnovatyi-Kogan, G.; Blasi, P.; Blay, P.; Bodaghee, A.; Boer, M.; Boettcher, M.; Bogdanov, S.; Bombaci, I.; Bonino, R.; Braga, J.; Brandt, W.; Brez, A.; Bucciantini, N.; Burderi, L.; Caiazzo, Ilaria; Campana, R.; Campana, S.; Capitanio, F.; Cappi, M.; Cardillo, M.; Casella, P.; Catmabacak, O.; Cenko, B.; Cerda-Duran, P.; Cerruti, C.; Chaty, S.; Chauvin, M.; Chen, Y.; Chenevez, J.; Chernyakova, M.; Cheung, C. C. T.; Christodoulou, D.; Connell, P.; Corbet, R.; Coti Zelati, F.; Covino, S.; Cui, W.; Cusumano, G.; D’Ai, A.; D’Ammando, F.; Dadina, M.; Dai, Z.; De Rosa, A.; de Ruvo, L.; Degenaar, N.; Del Santo, M.; Del Zanna, L.; Dewangan, G.; Di Cosimo, S.; Di Lalla, N.; Di Persio, G.; Di Salvo, T.; Dias, T.; Done, C.; Dovciak, M.; Doyle, G.; Ducci, L.; Elsner, R.; Enoto, T.; Escada, J.; Esposito, P.; Eyles, C.; Fabiani, S.; Falanga, M.; Falocco, S.; Fan, Y.; Fender, R.; Feroci, M.; Ferrigno, C.; Forman, W.; Foschini, L.; Fragile, C.; Fuerst, F.; Fujita, Y.; Gasent-Blesa, J. L.; Gelfand, J.; Gendre, B.; Ghirlanda, G.; Ghisellini, G.; Giroletti, M.; Goetz, D.; Gogus, E.; Gomez, J.-L.; Gonzalez, D.; Gonzalez-Riestra, R.; Gotthelf, E.; Gou, L.; Grandi, P.; Grinberg, V.; Grise, F.; Guidorzi, C.; Gurlebeck, N.; Guver, T.; Haggard, D.; Hardcastle, M.; Hartmann, D.; Haswell, C.; Heger, A.; Hernanz, M.; Heyl, J.; Ho, L.; Hoormann, J.; Horak, J.; Huovelin, J.; Huppenkothen, D.; Iaria, R.; Inam Sitki, C.; Ingram, A.; Israel, G.; Izzo, L.; Burgess, M.; Jackson, M.; Ji, L.; Jiang, J.; Johannsen, T.; Jones, C.; Jorstad, S.; Kajava, J. J. E.; Kalamkar, M.; Kalemci, E.; Kallman, T.; Kamble, A.; Kislat, F.; Kiss, M.; Klochkov, D.; Koerding, E.; Kolehmainen, M.; Koljonen, K.; Komossa, S.; Kong, A.; Korpela, S.; Kowalinski, M.; Krawczynski, H.; Kreykenbohm, I.; Kuss, M.; Lai, D.; Lan, M.; Larsson, J.; Laycock, S.; Lazzati, D.; Leahy, D.; Li, H.; Li, J.; Li, L.; Li, T.; Li, Z.; Linares, M.; Lister, M.; Liu, H.; Lodato, G.; Lohfink, A.; Longo, F.; Luna, G.; Lutovinov, A.; Mahmoodifar, S.; Maia, J.; Mainieri, V.; Maitra, C.; Maitra, D.; Majczyna, A.; Maldera, S.; Malyshev, D.; Manfreda, A.; Manousakis, A.; Manuel, R.; Margutti, R.; Marinucci, A.; Markoff, S.; Marscher, A.; Marshall, H.; Massaro, F.; McLaughlin, M.; Medina-Tanco, G.; Mehdipour, M.; Middleton, M.; Mignani, R.; Mimica, P.; Mineo, T.; Mingo, B.; Miniutti, G.; Mirac, S. M.; Morlino, G.; Motlagh, A. V.; Motta, S.; Mushtukov, A.; Nagataki, S.; Nardini, F.; Nattila, J.; Navarro, G. J.; Negri, B.; Negro, Matteo; Nenonen, S.; Neustroev, V.; Nicastro, F.; Norton, A.; Nucita, A.; O’Brien, P.; O’Dell, S.; Turriziani, S.

XIPE: The x-ray imaging polarimetry explorer

Soffitta P et al. 2016. XIPE: The x-ray imaging polarimetry explorer. Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. Astronomical Telescopes + Instrumentation vol. 9905, 990515.

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https://doi.org/10.48550/arXiv.1309.6995 [Preprint]

DOI

10.1117/12.2233046

Conference Paper | Published | English

Scopus indexed

Author

Soffitta, Paolo; Bellazzini, Ronaldo; Bozzo, Enrico; Burwitz, Vadim; Castro Tirado, Alberto; Costa, Enrico; Courvoisier, Thierry; Feng, Hua; Gburek, Szymon; Goosmann, Rene'; Karas, Vladimir; Matt, Giorgio
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Abstract

XIPE, the X-ray Imaging Polarimetry Explorer, is a mission dedicated to X-ray Astronomy. At the time of writing XIPE is in a competitive phase A as fourth medium size mission of ESA (M4). It promises to reopen the polarimetry window in high energy Astrophysics after more than 4 decades thanks to a detector that efficiently exploits the photoelectric effect and to X-ray optics with large effective area. XIPE uniqueness is time-spectrally-spatially- resolved X-ray polarimetry as a breakthrough in high energy astrophysics and fundamental physics. Indeed the payload consists of three Gas Pixel Detectors at the focus of three X-ray optics with a total effective area larger than one XMM mirror but with a low weight. The payload is compatible with the fairing of the Vega launcher. XIPE is designed as an observatory for X-ray astronomers with 75 % of the time dedicated to a Guest Observer competitive program and it is organized as a consortium across Europe with main contributions from Italy, Germany, Spain, United Kingdom, Poland, Sweden.

Publishing Year

2016

Date Published

2016-10-11

Proceedings Title

Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray

Publisher

SPIE

Volume

9905

Article Number

990515

Conference

Astronomical Telescopes + Instrumentation

Conference Location

Edinburgh, UK

Conference Date

2016-06-26 – 2016-07-01

ISSN

0168-9002

IST-REx-ID

15244

Cite this

Soffitta P, Bellazzini R, Bozzo E, et al. XIPE: The x-ray imaging polarimetry explorer. In: Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. Vol 9905. SPIE; 2016. doi:10.1117/12.2233046

Soffitta, P., Bellazzini, R., Bozzo, E., Burwitz, V., Castro Tirado, A., Costa, E., … Turriziani, S. (2016). XIPE: The x-ray imaging polarimetry explorer. In Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray (Vol. 9905). Edinburgh, UK: SPIE. https://doi.org/10.1117/12.2233046

Soffitta, Paolo, Ronaldo Bellazzini, Enrico Bozzo, Vadim Burwitz, Alberto Castro Tirado, Enrico Costa, Thierry Courvoisier, et al. “XIPE: The x-Ray Imaging Polarimetry Explorer.” In Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, Vol. 9905. SPIE, 2016. https://doi.org/10.1117/12.2233046.

P. Soffitta et al., “XIPE: The x-ray imaging polarimetry explorer,” in Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, Edinburgh, UK, 2016, vol. 9905.

Soffitta P et al. 2016. XIPE: The x-ray imaging polarimetry explorer. Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. Astronomical Telescopes + Instrumentation vol. 9905, 990515.

Soffitta, Paolo, et al. “XIPE: The x-Ray Imaging Polarimetry Explorer.” Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, vol. 9905, 990515, SPIE, 2016, doi:10.1117/12.2233046.

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