Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography
Nicolas W, Fäßler F, Meyerowitz E, Jensen G. 2021. Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography. Microscopy and Microanalysis. 27(S1), 3024–3026.
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Journal Article
| Published
| English
Author
Nicolas, William;
Fäßler, FlorianISTA 
;
Meyerowitz, Elliot;
Jensen, Grant
;
Meyerowitz, Elliot;
Jensen, GrantDepartment
Keywords
Publishing Year
Date Published
2021-08-01
Journal Title
Microscopy and Microanalysis
Publisher
Oxford University Press
Volume
27
Issue
S1
Page
3024-3026
ISSN
eISSN
IST-REx-ID
Cite this
Nicolas W, Fäßler F, Meyerowitz E, Jensen G. Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography. Microscopy and Microanalysis. 2021;27(S1):3024-3026. doi:10.1017/s1431927621010503
Nicolas, W., Fäßler, F., Meyerowitz, E., & Jensen, G. (2021). Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography. Microscopy and Microanalysis. Oxford University Press. https://doi.org/10.1017/s1431927621010503
Nicolas, William, Florian Fäßler, Elliot Meyerowitz, and Grant Jensen. “Peaking into the Plant Cell Wall Using Cryo-FIB Milling and Electron Cryo-Tomography.” Microscopy and Microanalysis. Oxford University Press, 2021. https://doi.org/10.1017/s1431927621010503.
W. Nicolas, F. Fäßler, E. Meyerowitz, and G. Jensen, “Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography,” Microscopy and Microanalysis, vol. 27, no. S1. Oxford University Press, pp. 3024–3026, 2021.
Nicolas W, Fäßler F, Meyerowitz E, Jensen G. 2021. Peaking into the plant cell wall using cryo-FIB milling and electron cryo-tomography. Microscopy and Microanalysis. 27(S1), 3024–3026.
Nicolas, William, et al. “Peaking into the Plant Cell Wall Using Cryo-FIB Milling and Electron Cryo-Tomography.” Microscopy and Microanalysis, vol. 27, no. S1, Oxford University Press, 2021, pp. 3024–26, doi:10.1017/s1431927621010503.
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