Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography
Rastelli A, Stoffel M, Malachias Â, Merdzhanova T, Katsaros G, Kern K, Metzger T, Schmidt O. 2008. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 8(5), 1404–1409.
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Journal Article
| Published
Author
Rastelli, Armando;
Stoffel, Mathieu;
Malachias, Ângelo S;
Merdzhanova, Tsvetelina;
Katsaros, GeorgiosISTA;
Kern, Klaus;
Metzger, Till H;
Schmidt, Oliver G
Abstract
Scanning probe microscopy; Semiconductor quantum dots; Composition gradients; Composition profiles; Nanotomography; Single quantum dots; Strained sige/si; Three-dimensional (3D); Wet-chemical etchings; X-ray scattering measurements; quantum dot; methodology; nanotechnology; optical tomography; scanning probe microscopy; three dimensional imaging; Imaging, Three-Dimensional; Materials Testing; Microscopy, Scanning Probe; Nanotechnology; Quantum Dots; Tomography,
Publishing Year
Date Published
2008-05-01
Journal Title
Nano Letters
Acknowledgement
This work was supported by the BMBF (No. 03N8711) and the EU project D-DotFET (No. 012150)
Volume
8
Issue
5
Page
1404 - 1409
IST-REx-ID
Cite this
Rastelli A, Stoffel M, Malachias Â, et al. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 2008;8(5):1404-1409. doi:10.1021/nl080290y
Rastelli, A., Stoffel, M., Malachias, Â., Merdzhanova, T., Katsaros, G., Kern, K., … Schmidt, O. (2008). Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. American Chemical Society. https://doi.org/10.1021/nl080290y
Rastelli, Armando, Mathieu Stoffel, Ângelo Malachias, Tsvetelina Merdzhanova, Georgios Katsaros, Klaus Kern, Till Metzger, and Oliver Schmidt. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” Nano Letters. American Chemical Society, 2008. https://doi.org/10.1021/nl080290y.
A. Rastelli et al., “Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography,” Nano Letters, vol. 8, no. 5. American Chemical Society, pp. 1404–1409, 2008.
Rastelli A, Stoffel M, Malachias Â, Merdzhanova T, Katsaros G, Kern K, Metzger T, Schmidt O. 2008. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 8(5), 1404–1409.
Rastelli, Armando, et al. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” Nano Letters, vol. 8, no. 5, American Chemical Society, 2008, pp. 1404–09, doi:10.1021/nl080290y.
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