Decipher the wavelength and intensity using photothermoelectric detectors
Zhou J, Xu S, Shuai Y, Sun Q, Ma H, Wang C, Wu H, Tan S, Wang Z, Yang L. 2024. Decipher the wavelength and intensity using photothermoelectric detectors. ACS Applied Materials and Interfaces.
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Journal Article
| Epub ahead of print
| English
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Author
Zhou, Jiamin;
Xu, ShengduoISTA;
Shuai, Yi;
Sun, Qiang;
Ma, Huangshui;
Wang, Chao;
Wu, Haijuan;
Tan, Shanshan;
Wang, Zegao;
Yang, Lei
Department
Abstract
Broadband photodetectors that can decipher the wavelength (λ) and intensity (I) of an unknown incident light are urgently demanded. Photothermoelectric (PTE) detectors can achieve ultrabroadband photodetection surpassing the bandgap limitation; however, their practical application is severely hampered by the lack of deciphering strategy. In this work, we report a variable elimination method to decipher λ and I of the incident lights based on an integrated Ag2Se film-based PTE detector. Nanostructured Ag2Se films with controlled thickness are synthesized using an ion sputtering of Ag and a room-temperature selenization method and then assembled into a detector. Under identical illumination, Ag2Se films of different thicknesses produce varying output photothermal voltages, influenced by factors including λ. By establishing a direct relationship between the photothermal voltage and the absorption of Ag2Se films of varied thickness, we successfully eliminate variables independent of λ, thus determining λ. Subsequently, I is determined by the calibrated responsivity relationship using obtained λ. Our PTE detector achieves a broadband spectrum from 400 to 950 nm and high accuracy, with deviations as low as ∼2.63 and ∼0.53% for deciphered λ and I, respectively. This method allows for self-powered broadband decipherable photodetection without a complex device architecture or computational assistance, which could boost the research enthusiasm and promote the commercialization of PTE broadband detectors.
Publishing Year
Date Published
2024-08-28
Journal Title
ACS Applied Materials and Interfaces
Acknowledgement
The authors appreciate the Analytical & Testing Center of Sichuan University and Ceshigo Research Service for their supports on material characterization. This study is financial supported by the fund of the State Key Laboratory of Solidification Processing in Northwestern Polytechnical University (NWPU, Grant SKLSP202315), the State Key Laboratory for Mechanical Behavior of Materials (Grant 20232509), and the International Scientific and Technological Innovation Cooperation of Sichuan Province (2024YFHZ0309).
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Zhou J, Xu S, Shuai Y, et al. Decipher the wavelength and intensity using photothermoelectric detectors. ACS Applied Materials and Interfaces. 2024. doi:10.1021/acsami.4c10489
Zhou, J., Xu, S., Shuai, Y., Sun, Q., Ma, H., Wang, C., … Yang, L. (2024). Decipher the wavelength and intensity using photothermoelectric detectors. ACS Applied Materials and Interfaces. American Chemical Society. https://doi.org/10.1021/acsami.4c10489
Zhou, Jiamin, Shengduo Xu, Yi Shuai, Qiang Sun, Huangshui Ma, Chao Wang, Haijuan Wu, Shanshan Tan, Zegao Wang, and Lei Yang. “Decipher the Wavelength and Intensity Using Photothermoelectric Detectors.” ACS Applied Materials and Interfaces. American Chemical Society, 2024. https://doi.org/10.1021/acsami.4c10489.
J. Zhou et al., “Decipher the wavelength and intensity using photothermoelectric detectors,” ACS Applied Materials and Interfaces. American Chemical Society, 2024.
Zhou J, Xu S, Shuai Y, Sun Q, Ma H, Wang C, Wu H, Tan S, Wang Z, Yang L. 2024. Decipher the wavelength and intensity using photothermoelectric detectors. ACS Applied Materials and Interfaces.
Zhou, Jiamin, et al. “Decipher the Wavelength and Intensity Using Photothermoelectric Detectors.” ACS Applied Materials and Interfaces, American Chemical Society, 2024, doi:10.1021/acsami.4c10489.
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PMID: 39194354
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