Extreme conductance suppression in molecular siloxanes

Li H, Garner MH, Su TA, Jensen A, Inkpen MS, Steigerwald ML, Venkataraman L, Solomon GC, Nuckolls C. 2017. Extreme conductance suppression in molecular siloxanes. Journal of the American Chemical Society. 139(30), 10212–10215.

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Journal Article | Published | English

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Author
Li, Haixing; Garner, Marc H.; Su, Timothy A.; Jensen, Anders; Inkpen, Michael S.; Steigerwald, Michael L.; Venkataraman, LathaISTA ; Solomon, Gemma C.; Nuckolls, Colin
Abstract
Single-molecule conductance studies have traditionally focused on creating highly conducting molecular wires. However, progress in nanoscale electronics demands insulators just as it needs conductors. Here we describe the single-molecule length-dependent conductance properties of the classic silicon dioxide insulator. We synthesize molecular wires consisting of Si–O repeat units and measure their conductance through the scanning tunneling microscope-based break-junction method. These molecules yield conductance lower than alkanes of the same length and the largest length-dependent conductance decay of any molecular systems measured to date. We calculate single-molecule junction transmission and the complex band structure of the infinite 1D material for siloxane, in comparison with silane and alkane, and show that the large conductance decay is intrinsic to the nature of the Si–O bond. This work highlights the potential for siloxanes to function as molecular insulators in electronics.
Publishing Year
Date Published
2017-07-13
Journal Title
Journal of the American Chemical Society
Publisher
American Chemical Society
Volume
139
Issue
30
Page
10212-10215
ISSN
eISSN
IST-REx-ID

Cite this

Li H, Garner MH, Su TA, et al. Extreme conductance suppression in molecular siloxanes. Journal of the American Chemical Society. 2017;139(30):10212-10215. doi:10.1021/jacs.7b05599
Li, H., Garner, M. H., Su, T. A., Jensen, A., Inkpen, M. S., Steigerwald, M. L., … Nuckolls, C. (2017). Extreme conductance suppression in molecular siloxanes. Journal of the American Chemical Society. American Chemical Society. https://doi.org/10.1021/jacs.7b05599
Li, Haixing, Marc H. Garner, Timothy A. Su, Anders Jensen, Michael S. Inkpen, Michael L. Steigerwald, Latha Venkataraman, Gemma C. Solomon, and Colin Nuckolls. “Extreme Conductance Suppression in Molecular Siloxanes.” Journal of the American Chemical Society. American Chemical Society, 2017. https://doi.org/10.1021/jacs.7b05599.
H. Li et al., “Extreme conductance suppression in molecular siloxanes,” Journal of the American Chemical Society, vol. 139, no. 30. American Chemical Society, pp. 10212–10215, 2017.
Li H, Garner MH, Su TA, Jensen A, Inkpen MS, Steigerwald ML, Venkataraman L, Solomon GC, Nuckolls C. 2017. Extreme conductance suppression in molecular siloxanes. Journal of the American Chemical Society. 139(30), 10212–10215.
Li, Haixing, et al. “Extreme Conductance Suppression in Molecular Siloxanes.” Journal of the American Chemical Society, vol. 139, no. 30, American Chemical Society, 2017, pp. 10212–15, doi:10.1021/jacs.7b05599.

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PMID: 28702995
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