Overparameterized models for vector fields

Rotker K, Bashat DB, Bronstein AM. 2020. Overparameterized models for vector fields. SIAM Journal on Imaging Sciences. 13(3), 1386–1414.

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Journal Article | Published | English

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Author
Rotker, Keren; Bashat, Dafna Ben; Bronstein, Alex M.ISTA
Abstract
Vector fields arise in a variety of quantity measure and visualization techniques, such as fluid flow imaging, motion estimation, deformation measures, and color imaging, leading to a better understanding of physical phenomena. Recent progress in vector field imaging technologies has emphasized the need for efficient noise removal and reconstruction algorithms. A key ingredient in the successful extraction of signals from noisy measurements is prior information, which can often be represented as a parameterized model. In this work, we extend the overparameterization variational framework in order to perform model-based reconstruction of vector fields. The overparameterization methodology combines local modeling of the data with global model parameter regularization. By considering the vector field as a linear combination of basis vector fields and appropriate scale and rotation coefficients, we can reduce the denoising problem to a simpler form of coefficient recovery. We introduce two versions of the overparameterization framework: a total variation-based method and a sparsity-based method, which relies on the cosparse analysis model. We demonstrate the efficiency of the proposed frameworks for two- and three-dimensional vector fields with linear and quadratic overparameterization models.
Publishing Year
Date Published
2020-01-01
Journal Title
SIAM Journal on Imaging Sciences
Publisher
Society for Industrial & Applied Mathematics
Volume
13
Issue
3
Page
1386-1414
eISSN
IST-REx-ID

Cite this

Rotker K, Bashat DB, Bronstein AM. Overparameterized models for vector fields. SIAM Journal on Imaging Sciences. 2020;13(3):1386-1414. doi:10.1137/19m1280697
Rotker, K., Bashat, D. B., & Bronstein, A. M. (2020). Overparameterized models for vector fields. SIAM Journal on Imaging Sciences. Society for Industrial & Applied Mathematics. https://doi.org/10.1137/19m1280697
Rotker, Keren, Dafna Ben Bashat, and Alex M. Bronstein. “Overparameterized Models for Vector Fields.” SIAM Journal on Imaging Sciences. Society for Industrial & Applied Mathematics, 2020. https://doi.org/10.1137/19m1280697.
K. Rotker, D. B. Bashat, and A. M. Bronstein, “Overparameterized models for vector fields,” SIAM Journal on Imaging Sciences, vol. 13, no. 3. Society for Industrial & Applied Mathematics, pp. 1386–1414, 2020.
Rotker K, Bashat DB, Bronstein AM. 2020. Overparameterized models for vector fields. SIAM Journal on Imaging Sciences. 13(3), 1386–1414.
Rotker, Keren, et al. “Overparameterized Models for Vector Fields.” SIAM Journal on Imaging Sciences, vol. 13, no. 3, Society for Industrial & Applied Mathematics, 2020, pp. 1386–414, doi:10.1137/19m1280697.

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