Implications of polishing techniques in quantitative X-ray microanalysis
Remond G, Nockolds C, Phillips M, Roques-Carmes C. 2002. Implications of polishing techniques in quantitative X-ray microanalysis. Journal of Research of the National Institute of Standards and Technology. 107(6), 639–662.
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Journal Article
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| English
Author
Remond, G.;
Nockolds, C.;
Phillips, M.;
Roques-Carmes, CharlesISTA
Abstract
Specimen preparation using abrasives results in surface and subsurface mechanical (stresses, strains), geometrical (roughness), chemical (contaminants, reaction products) and physical modifications (structure, texture, lattice defects). The mechanisms involved in polishing with abrasives are presented to illustrate the effects of surface topography, surface and subsurface composition and induced lattice defects on the accuracy of quantitative x-ray microanalysis of mineral materials with the electron probe microanalyzer (EPMA).
Keywords
Publishing Year
Date Published
2002-12-01
Journal Title
Journal of Research of the National Institute of Standards and Technology
Publisher
National Institute of Standards and Technology
Volume
107
Issue
6
Page
639-662
ISSN
IST-REx-ID
Cite this
Remond G, Nockolds C, Phillips M, Roques-Carmes C. Implications of polishing techniques in quantitative X-ray microanalysis. Journal of Research of the National Institute of Standards and Technology. 2002;107(6):639-662. doi:10.6028/jres.107.052
Remond, G., Nockolds, C., Phillips, M., & Roques-Carmes, C. (2002). Implications of polishing techniques in quantitative X-ray microanalysis. Journal of Research of the National Institute of Standards and Technology. National Institute of Standards and Technology. https://doi.org/10.6028/jres.107.052
Remond, G., C. Nockolds, M. Phillips, and Charles Roques-Carmes. “Implications of Polishing Techniques in Quantitative X-Ray Microanalysis.” Journal of Research of the National Institute of Standards and Technology. National Institute of Standards and Technology, 2002. https://doi.org/10.6028/jres.107.052.
G. Remond, C. Nockolds, M. Phillips, and C. Roques-Carmes, “Implications of polishing techniques in quantitative X-ray microanalysis,” Journal of Research of the National Institute of Standards and Technology, vol. 107, no. 6. National Institute of Standards and Technology, pp. 639–662, 2002.
Remond G, Nockolds C, Phillips M, Roques-Carmes C. 2002. Implications of polishing techniques in quantitative X-ray microanalysis. Journal of Research of the National Institute of Standards and Technology. 107(6), 639–662.
Remond, G., et al. “Implications of Polishing Techniques in Quantitative X-Ray Microanalysis.” Journal of Research of the National Institute of Standards and Technology, vol. 107, no. 6, National Institute of Standards and Technology, 2002, pp. 639–62, doi:10.6028/jres.107.052.
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PMID: 27446758
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