Scanning tunneling microscope-based break-junction technique - A tutorial
York E, Venkataraman L. 2026. Scanning tunneling microscope-based break-junction technique - A tutorial. ACS Physical Chemistry Au. 6(3), 408–424.
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Corresponding author has ISTA affiliation
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Abstract
Over the past two decades, molecular electronics has made significant progress toward discovering nanoscale analogues of conventional electronic components, largely enabled by the development of the scanning tunneling microscope-based break-junction (STM-BJ) technique. The STM-BJ technique enables precise and highly reproducible measurement of a molecule’s electronic transport properties, making it a powerful technique to explore physiochemical and electrochemical phenomena that are otherwise difficult to access. It has gained substantial popularity in the past 20 years, with experiments becoming increasingly diverse and sophisticated. Despite the wealth of literature, an accessible, practical guide to performing STM-BJ experiments and interpreting the data is largely absent. This tutorial includes a brief background into the development of STM-BJ measurements, followed by detailed explanations of instrumentation, data collection, statistical analysis, variations on standard experiments, and some troubleshooting methods. It is aimed at researchers looking to begin or improve STM-BJ studies in their laboratories, graduate students and postdoctoral researchers learning the technique, and readers seeking to critically evaluate the growing body of STM-BJ literature.
Publishing Year
Date Published
2026-05-04
Journal Title
ACS Physical Chemistry Au
Publisher
American Chemical Society
Acknowledgement
We thank Michael Inkpen, Timothy Su, Masha Kamenetska, and Wanzhuo Shi for comments and Jyotisman Hazarika for data collection. This work was supported in part by the National Science Foundation (NSF-DMR 2241180) and by the Institute of Science and Technology Austria.
Volume
6
Issue
3
Page
408-424
eISSN
IST-REx-ID
Cite this
York E, Venkataraman L. Scanning tunneling microscope-based break-junction technique - A tutorial. ACS Physical Chemistry Au. 2026;6(3):408-424. doi:10.1021/acsphyschemau.6c00026
York, E., & Venkataraman, L. (2026). Scanning tunneling microscope-based break-junction technique - A tutorial. ACS Physical Chemistry Au. American Chemical Society. https://doi.org/10.1021/acsphyschemau.6c00026
York, Emma, and Latha Venkataraman. “Scanning Tunneling Microscope-Based Break-Junction Technique - A Tutorial.” ACS Physical Chemistry Au. American Chemical Society, 2026. https://doi.org/10.1021/acsphyschemau.6c00026.
E. York and L. Venkataraman, “Scanning tunneling microscope-based break-junction technique - A tutorial,” ACS Physical Chemistry Au, vol. 6, no. 3. American Chemical Society, pp. 408–424, 2026.
York E, Venkataraman L. 2026. Scanning tunneling microscope-based break-junction technique - A tutorial. ACS Physical Chemistry Au. 6(3), 408–424.
York, Emma, and Latha Venkataraman. “Scanning Tunneling Microscope-Based Break-Junction Technique - A Tutorial.” ACS Physical Chemistry Au, vol. 6, no. 3, American Chemical Society, 2026, pp. 408–24, doi:10.1021/acsphyschemau.6c00026.
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