Generating tests from counterexamples

Beyer D, Chlipala A, Henzinger TA, Jhala R, Majumdar R. 2004. Generating tests from counterexamples. ICSE: Software Engineering, 326–335.

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DOI
10.1109/ICSE.2004.1317455
Conference Paper | Published
Author
Beyer, Dirk; Chlipala, Adam J; Henzinger, Thomas AISTA ; Jhala, Ranjit; Majumdar, Ritankar S
Abstract
We have extended the software model checker BLAST to automatically generate test suites that guarantee full coverage with respect to a given predicate. More precisely, given a C program and a target predicate p, BLAST determines the set L of program locations which program execution can reach with p true, and automatically generates a set of test vectors that exhibit the truth of p at all locations in L. We have used BLAST to generate test suites and to detect dead code in C programs with up to 30 K lines of code. The analysis and test vector generation is fully automatic (no user intervention) and exact (no false positives).
Publishing Year
2004
Date Published
2004-07-26
Publisher
IEEE
Page
326 - 335
Conference
ICSE: Software Engineering
IST-REx-ID
4581

Cite this

Beyer D, Chlipala A, Henzinger TA, Jhala R, Majumdar R. Generating tests from counterexamples. In: IEEE; 2004:326-335. doi:10.1109/ICSE.2004.1317455
Beyer, D., Chlipala, A., Henzinger, T. A., Jhala, R., & Majumdar, R. (2004). Generating tests from counterexamples (pp. 326–335). Presented at the ICSE: Software Engineering, IEEE. https://doi.org/10.1109/ICSE.2004.1317455
Beyer, Dirk, Adam Chlipala, Thomas A Henzinger, Ranjit Jhala, and Ritankar Majumdar. “Generating Tests from Counterexamples,” 326–35. IEEE, 2004. https://doi.org/10.1109/ICSE.2004.1317455.
D. Beyer, A. Chlipala, T. A. Henzinger, R. Jhala, and R. Majumdar, “Generating tests from counterexamples,” presented at the ICSE: Software Engineering, 2004, pp. 326–335.
Beyer D, Chlipala A, Henzinger TA, Jhala R, Majumdar R. 2004. Generating tests from counterexamples. ICSE: Software Engineering, 326–335.
Beyer, Dirk, et al. Generating Tests from Counterexamples. IEEE, 2004, pp. 326–35, doi:10.1109/ICSE.2004.1317455.

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