6 Publications

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[6]
2025 | Published | Journal Article | IST-REx-ID: 20705 | OA | PlanS
Stöllner A, Lenton IC, Volosniev A, Millen J, Shibuya R, Ishii H, Rak D, Alpichshev Z, David G, Signorell R, Muller CJ, Waitukaitis SR. 2025. Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air. Physical Review Letters. 135(21), 218202.
[Published Version] View | Files available | DOI | arXiv
 
[5]
2025 | Published | Journal Article | IST-REx-ID: 20481 | OA | PlanS
Pertl F, Lenton IC, Cramer T, Waitukaitis SR. 2025. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. Physical Review Letters. 135(14), 146202.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[4]
2025 | Published | Journal Article | IST-REx-ID: 20847 | OA | PlanS
Fitzgerald E, Clavaud C, Das D, Lenton IC, Waitukaitis SR. 2025. Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter. Physical Review E. 112(6), 065418.
[Published Version] View | Files available | DOI | arXiv
 
[3]
2025 | Published | Journal Article | IST-REx-ID: 20295 | OA | PlanS
Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2025. A duality between surface charge and work function in scanning Kelvin probe microscopy. Advanced Materials Interfaces. 12(19), e00521.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[2]
2024 | Published | Journal Article | IST-REx-ID: 17373 | OA
Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2024. Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging. Journal of Applied Physics. 136(4), 045305.
[Published Version] View | Files available | DOI | WoS
 
[1]
2023 | Published | Conference Abstract | IST-REx-ID: 14864 | OA
Stöllner A, Lenton IC, Muller CJ, Waitukaitis SR. 2023. Measuring spontaneous charging of single aerosol particles. EGU General Assembly 2023. EGU General Assembly, 6166.
[Published Version] View | Files available | DOI
 

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6 Publications

Mark all

[6]
2025 | Published | Journal Article | IST-REx-ID: 20705 | OA | PlanS
Stöllner A, Lenton IC, Volosniev A, Millen J, Shibuya R, Ishii H, Rak D, Alpichshev Z, David G, Signorell R, Muller CJ, Waitukaitis SR. 2025. Using optical tweezers to simultaneously trap, charge, and measure the charge of a microparticle in air. Physical Review Letters. 135(21), 218202.
[Published Version] View | Files available | DOI | arXiv
 
[5]
2025 | Published | Journal Article | IST-REx-ID: 20481 | OA | PlanS
Pertl F, Lenton IC, Cramer T, Waitukaitis SR. 2025. No time for surface charge: How bulk conductivity hides charge patterns from Kelvin probe force microscopy in contact-electrified surfaces. Physical Review Letters. 135(14), 146202.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[4]
2025 | Published | Journal Article | IST-REx-ID: 20847 | OA | PlanS
Fitzgerald E, Clavaud C, Das D, Lenton IC, Waitukaitis SR. 2025. Rolling at right angles: Magnetic anisotropy enables dual-anisotropic active matter. Physical Review E. 112(6), 065418.
[Published Version] View | Files available | DOI | arXiv
 
[3]
2025 | Published | Journal Article | IST-REx-ID: 20295 | OA | PlanS
Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2025. A duality between surface charge and work function in scanning Kelvin probe microscopy. Advanced Materials Interfaces. 12(19), e00521.
[Published Version] View | Files available | DOI | WoS | arXiv
 
[2]
2024 | Published | Journal Article | IST-REx-ID: 17373 | OA
Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. 2024. Beyond the blur: Using experimentally determined point spread functions to improve scanning Kelvin probe imaging. Journal of Applied Physics. 136(4), 045305.
[Published Version] View | Files available | DOI | WoS
 
[1]
2023 | Published | Conference Abstract | IST-REx-ID: 14864 | OA
Stöllner A, Lenton IC, Muller CJ, Waitukaitis SR. 2023. Measuring spontaneous charging of single aerosol particles. EGU General Assembly 2023. EGU General Assembly, 6166.
[Published Version] View | Files available | DOI
 

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Citation Style: ISTA Annual Report

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