Emily Yu
3 Publications
2025 | Published | Conference Paper | IST-REx-ID: 19668 |

Yu, Emily, et al. “Neural Control and Certificate Repair via Runtime Monitoring.” Proceedings of the 39th AAAI Conference on Artificial Intelligence, vol. 39, no. 25, Association for the Advancement of Artificial Intelligence, 2025, pp. 26409–17, doi:10.1609/aaai.v39i25.34840.
[Preprint]
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| arXiv
2024 | Published | Conference Paper | IST-REx-ID: 17413 |

Froleyks, Nils, et al. “Certifying Phase Abstraction.” Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 14739, Springer Nature, 2024, pp. 284–303, doi:10.1007/978-3-031-63498-7_17.
[Published Version]
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| arXiv
2024 | Submitted | Conference Paper | IST-REx-ID: 17053
Froleyks, Nils, et al. “Ternary Simulation as Abstract Interpretation (Work in Progress).” 27th Workshop on Methods and Description Languages for Modeling and Verification of Circuits and Systems, pp. 148–51.
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Grants
3 Publications
2025 | Published | Conference Paper | IST-REx-ID: 19668 |

Yu, Emily, et al. “Neural Control and Certificate Repair via Runtime Monitoring.” Proceedings of the 39th AAAI Conference on Artificial Intelligence, vol. 39, no. 25, Association for the Advancement of Artificial Intelligence, 2025, pp. 26409–17, doi:10.1609/aaai.v39i25.34840.
[Preprint]
View
| DOI
| Download Preprint (ext.)
| arXiv
2024 | Published | Conference Paper | IST-REx-ID: 17413 |

Froleyks, Nils, et al. “Certifying Phase Abstraction.” Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 14739, Springer Nature, 2024, pp. 284–303, doi:10.1007/978-3-031-63498-7_17.
[Published Version]
View
| Files available
| DOI
| arXiv
2024 | Submitted | Conference Paper | IST-REx-ID: 17053
Froleyks, Nils, et al. “Ternary Simulation as Abstract Interpretation (Work in Progress).” 27th Workshop on Methods and Description Languages for Modeling and Verification of Circuits and Systems, pp. 148–51.
View