Emily Yu
3 Publications
2025 | Published | Conference Paper | IST-REx-ID: 19668 | 
Yu E, Zikelic D, Henzinger TA. Neural control and certificate repair via runtime monitoring. In: Proceedings of the 39th AAAI Conference on Artificial Intelligence. Vol 39. Association for the Advancement of Artificial Intelligence; 2025:26409-26417. doi:10.1609/aaai.v39i25.34840
[Preprint]
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| arXiv
2024 | Published | Conference Paper | IST-REx-ID: 17413 |
Froleyks N, Yu E, Biere A, Heljanko K. Certifying phase abstraction. In: Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). Vol 14739. Springer Nature; 2024:284-303. doi:10.1007/978-3-031-63498-7_17
[Published Version]
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| arXiv
2024 | Submitted | Conference Paper | IST-REx-ID: 17053
Froleyks N, Yu E, Biere A. Ternary simulation as abstract interpretation (Work in Progress). In: 27th Workshop on Methods and Description Languages for Modeling and Verification of Circuits and Systems. ; :148-151.
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Grants
3 Publications
2025 | Published | Conference Paper | IST-REx-ID: 19668 |
Yu E, Zikelic D, Henzinger TA. Neural control and certificate repair via runtime monitoring. In: Proceedings of the 39th AAAI Conference on Artificial Intelligence. Vol 39. Association for the Advancement of Artificial Intelligence; 2025:26409-26417. doi:10.1609/aaai.v39i25.34840
[Preprint]
View
| DOI
| Download Preprint (ext.)
| arXiv
2024 | Published | Conference Paper | IST-REx-ID: 17413 |
Froleyks N, Yu E, Biere A, Heljanko K. Certifying phase abstraction. In: Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). Vol 14739. Springer Nature; 2024:284-303. doi:10.1007/978-3-031-63498-7_17
[Published Version]
View
| Files available
| DOI
| arXiv
2024 | Submitted | Conference Paper | IST-REx-ID: 17053
Froleyks N, Yu E, Biere A. Ternary simulation as abstract interpretation (Work in Progress). In: 27th Workshop on Methods and Description Languages for Modeling and Verification of Circuits and Systems. ; :148-151.
View