Boosted metric learning for 3D multi-modal deformable registration
Michel F, Bronstein M, Bronstein AM, Paragios N. 2011. Boosted metric learning for 3D multi-modal deformable registration. 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619.
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Conference Paper
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Scopus indexed
Author
Michel, Fabrice;
Bronstein, Michael;
Bronstein, Alex M.ISTA ;
Paragios, Nikos
Abstract
Defining a suitable metric is one of the biggest challenges in deformable image fusion from different modalities. In this paper, we propose a novel approach for multi-modal metric learning in the deformable registration framework that consists of embedding data from both modalities into a common metric space whose metric is used to parametrize the similarity. Specifically, we use image representation in the Fourier/Gabor space which introduces invariance to the local pose parameters, and the Hamming metric as the target embedding space, which allows constructing the embedding using boosted learning algorithms. The resulting metric is incorporated into a discrete optimization framework. Very promising results demonstrate the potential of the proposed method.
Publishing Year
Date Published
2011-06-09
Proceedings Title
2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro
Publisher
IEEE
Article Number
5872619
Conference
8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro
Conference Location
Chicago, IL, United States
Conference Date
2011-03-30 – 2011-04-02
ISBN
eISSN
IST-REx-ID
Cite this
Michel F, Bronstein M, Bronstein AM, Paragios N. Boosted metric learning for 3D multi-modal deformable registration. In: 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. IEEE; 2011. doi:10.1109/isbi.2011.5872619
Michel, F., Bronstein, M., Bronstein, A. M., & Paragios, N. (2011). Boosted metric learning for 3D multi-modal deformable registration. In 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. Chicago, IL, United States: IEEE. https://doi.org/10.1109/isbi.2011.5872619
Michel, Fabrice, Michael Bronstein, Alex M. Bronstein, and Nikos Paragios. “Boosted Metric Learning for 3D Multi-Modal Deformable Registration.” In 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. IEEE, 2011. https://doi.org/10.1109/isbi.2011.5872619.
F. Michel, M. Bronstein, A. M. Bronstein, and N. Paragios, “Boosted metric learning for 3D multi-modal deformable registration,” in 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Chicago, IL, United States, 2011.
Michel F, Bronstein M, Bronstein AM, Paragios N. 2011. Boosted metric learning for 3D multi-modal deformable registration. 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619.
Michel, Fabrice, et al. “Boosted Metric Learning for 3D Multi-Modal Deformable Registration.” 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619, IEEE, 2011, doi:10.1109/isbi.2011.5872619.