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1 Publication
2018 | Published | Conference Paper | IST-REx-ID: 18285
Haim, H., Elmalem, S., Giryes, R., Bronstein, A. M., & Marom, E. (2018). Deep learned phase mask for single image depth estimation and 3D scanning. In Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP) (Vol. Part F99-COSI 2018). Orlando, FL, United States: OSA. https://doi.org/10.1364/cosi.2018.cw3b.3
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