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2 Publications
2020 | Published | Journal Article | IST-REx-ID: 18252
Rotker, Keren, et al. “Overparameterized Models for Vector Fields.” SIAM Journal on Imaging Sciences, vol. 13, no. 3, Society for Industrial & Applied Mathematics, 2020, pp. 1386–414, doi:10.1137/19m1280697.
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| DOI
2016 | Published | Journal Article | IST-REx-ID: 18430
Bian, Xiao, et al. “Sparsity and Nullity: Paradigms for Analysis Dictionary Learning.” SIAM Journal on Imaging Sciences, vol. 9, no. 3, Society for Industrial & Applied Mathematics, 2016, pp. 1107–26, doi:10.1137/15m1030376.
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| DOI