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5 Publications


2023 | Conference Paper | IST-REx-ID: 14771 | OA
Iofinova, E. B., Peste, E.-A., & Alistarh, D.-A. (2023). Bias in pruned vision models: In-depth analysis and countermeasures. In 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 24364–24373). Vancouver, BC, Canada: IEEE. https://doi.org/10.1109/cvpr52729.2023.02334
[Preprint] View | Files available | DOI | Download Preprint (ext.) | WoS | arXiv
 

2022 | Conference Paper | IST-REx-ID: 12299 | OA
Iofinova, E. B., Peste, E.-A., Kurtz, M., & Alistarh, D.-A. (2022). How well do sparse ImageNet models transfer? In 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 12256–12266). New Orleans, LA, United States: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/cvpr52688.2022.01195
[Preprint] View | Files available | DOI | Download Preprint (ext.) | WoS | arXiv
 

2022 | Conference Paper | IST-REx-ID: 14114 | OA
Zietlow, D., Lohaus, M., Balakrishnan, G., Kleindessner, M., Locatello, F., Scholkopf, B., & Russell, C. (2022). Leveling down in computer vision: Pareto inefficiencies in fair deep classifiers. In 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 10400–10411). New Orleans, LA, United States: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/cvpr52688.2022.01016
[Preprint] View | DOI | Download Preprint (ext.) | arXiv
 

2020 | Conference Paper | IST-REx-ID: 8186 | OA
Henderson, P. M., Tsiminaki, V., & Lampert, C. (2020). Leveraging 2D data to learn textured 3D mesh generation. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 7498–7507). Virtual: IEEE. https://doi.org/10.1109/CVPR42600.2020.00752
[Submitted Version] View | Files available | DOI | Download Submitted Version (ext.) | arXiv
 

2018 | Conference Paper | IST-REx-ID: 10882 | OA
Uijlings, J., Konyushkova, K., Lampert, C., & Ferrari, V. (2018). Learning intelligent dialogs for bounding box annotation. In 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 9175–9184). Salt Lake City, UT, United States: IEEE. https://doi.org/10.1109/cvpr.2018.00956
[Preprint] View | DOI | Download Preprint (ext.) | WoS | arXiv
 

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