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1 Publication
2011 | Published | Conference Paper | IST-REx-ID: 18406
Michel F, Bronstein M, Bronstein AM, Paragios N. Boosted metric learning for 3D multi-modal deformable registration. In: 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. IEEE; 2011. doi:10.1109/isbi.2011.5872619
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