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1 Publication
2011 | Published | Conference Paper | IST-REx-ID: 18406
Michel, F., Bronstein, M., Bronstein, A. M., & Paragios, N. (2011). Boosted metric learning for 3D multi-modal deformable registration. In 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. Chicago, IL, United States: IEEE. https://doi.org/10.1109/isbi.2011.5872619
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