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1 Publication
2011 | Published | Conference Paper | IST-REx-ID: 18406
Michel F, Bronstein M, Bronstein AM, Paragios N. 2011. Boosted metric learning for 3D multi-modal deformable registration. 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro. 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 5872619.
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