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1 Publication
2011 | Published | Conference Paper | IST-REx-ID: 18406
F. Michel, M. Bronstein, A. M. Bronstein, and N. Paragios, “Boosted metric learning for 3D multi-modal deformable registration,” in 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Chicago, IL, United States, 2011.
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| DOI