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1 Publication


2025 | Epub ahead of print | Journal Article | IST-REx-ID: 20295 | OA | PlanS
Lenton IC, Pertl F, Shafeek LB, Waitukaitis SR. A duality between surface charge and work function in scanning Kelvin probe microscopy. Advanced Materials Interfaces. 2025. doi:10.1002/admi.202500521
[Published Version] View | DOI | Download Published Version (ext.) | WoS | arXiv
 

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