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1 Publication


2025 | Published | Journal Article | IST-REx-ID: 20295 | OA | PlanS
I. C. Lenton, F. Pertl, L. B. Shafeek, and S. R. Waitukaitis, “A duality between surface charge and work function in scanning Kelvin probe microscopy,” Advanced Materials Interfaces, vol. 12, no. 19. Wiley, 2025.
[Published Version] View | Files available | DOI | WoS | arXiv
 

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