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1 Publication


2025 | Epub ahead of print | Journal Article | IST-REx-ID: 20295 | OA | PlanS
Lenton, Isaac C., et al. “A Duality between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy.” Advanced Materials Interfaces, Wiley, 2025, doi:10.1002/admi.202500521.
[Published Version] View | DOI | Download Published Version (ext.) | WoS | arXiv
 

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