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1 Publication


2025 | Epub ahead of print | Journal Article | IST-REx-ID: 20295 | OA | PlanS
A duality between surface charge and work function in scanning Kelvin probe microscopy
I.C. Lenton, F. Pertl, L.B. Shafeek, S.R. Waitukaitis, Advanced Materials Interfaces (2025).
[Published Version] View | DOI | Download Published Version (ext.) | WoS | arXiv
 

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