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1 Publication
2025 | Epub ahead of print | Journal Article | IST-REx-ID: 20295 | 
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Lenton, I. C., Pertl, F., Shafeek, L. B., & Waitukaitis, S. R. (2025). A duality between surface charge and work function in scanning Kelvin probe microscopy. Advanced Materials Interfaces. Wiley. https://doi.org/10.1002/admi.202500521
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